Patents by Inventor Douglas Paul Lutz

Douglas Paul Lutz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Phased array scanning into a curvature
    Patent number: 8972206
    Abstract: A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.
    Type: Grant
    Filed: January 26, 2012
    Date of Patent: March 3, 2015
    Assignee: General Electric Company
    Inventors: Chad Martin Shaffer, Peter Renzel, Jerome Poirier, Michael Maria Berke, Douglas Paul Lutz, Rai Mohan Dasarathan, Anandamurugan S
  • PHASED ARRAY SCANNING INTO A CURVATURE
    Publication number: 20130197822
    Abstract: A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.
    Type: Application
    Filed: January 26, 2012
    Publication date: August 1, 2013
    Inventors: Chad Martin Shaffer, Peter Renzel, Jerome Poirier, Michael Maria Berke, Douglas Paul Lutz, Rai Mohan Dasarathan, Anandamurugan S