Patents by Inventor Douglas Y. Kim

Douglas Y. Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5416512
    Abstract: A calibration system for circuit inspection tools in which analog threshold levels are automatically set by digital signals. The inspection too includes an optical detector system that provides video signals to channels each containing an analog processor. In the analog processor an analog reference signal, an analog video inspection signal which may contain a defect indication and a digital threshold signal are employed. The digital threshold signal is converted into an analog threshold signal which is summed with the analog reference signal that has been inverted. The inverted, thresholded reference signal is then summed with the analog video signal. The summed analog video signal and thresholded reference signal is compared with a zero level. If the sum is greater than zero a defect is indicated.
    Type: Grant
    Filed: December 23, 1993
    Date of Patent: May 16, 1995
    Assignee: International Business Machines Corporation
    Inventors: Douglas Y. Kim, Kurt R. Muller
  • Patent number: 5220617
    Abstract: A method and apparatus for the inspection and handling of surface level defects is taught. Briefly stated, the object to be inspected is positioned. A Laser light is polarized into at least one orientation and then reflected off of a rotated polygon mirror. This causes the light to "move" over the area of interest. A plurality of fiber optic bundles are used to receive and conduct the reflected light back to photomultipliers. The photomultipliers convert the light into electrical signals while associated electronics digitize the signals, keeping track of pixels which are produced. By keeping track of pixel edge boundaries and determining if certain thresholds are exceeded or not met as appropriate, the area of interest can be checked for a variety of defects. By comparison of the defects to a reference base, the defects and hence the items inspected can be categorized.
    Type: Grant
    Filed: September 4, 1991
    Date of Patent: June 15, 1993
    Assignee: International Business Machines Corporation
    Inventors: Kenneth A. Bird, Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller, Lawrence D. Thorp
  • Patent number: 5216485
    Abstract: A method and apparatus for the inspection and handling of surface level defects is taught. Briefly stated, the object to be inspected is positioned. A Laser light is polarized into at least one orientation and then reflected off of a rotated polygon mirror. This causes the light to "move" over the area of interest. A plurality of fiber optic bundles are used to receive and conduct the reflected light back to photomultipliers. The photomultiplers convert the light into electrical signals while associated electronics digitize the signals, keeping track of pixels which are produced. By keeping track of pixel edge boundaries and determining if certain thresholds are exceeded or not met as appropriate, the area of interest can be checked for a variety of defects. By comparison of the defects to a reference base, the defects and hence the items inspected can be categorized.
    Type: Grant
    Filed: September 4, 1991
    Date of Patent: June 1, 1993
    Assignee: International Business Machines Corporation
    Inventors: Kenneth A. Bird, Douglas Y. Kim, Stephen J. Kish, Julius J. Lambright, Kurt R. Muller, Lawrence D. Thorp