Abstract: A battery module minimizes damage to internal configurations generated in an assembly process. The battery module includes a cell assembly provided with an electrode lead and a plurality of secondary batteries stacked; a bus bar assembly provided with a bus bar frame located on a front or rear of the cell assembly, and a bus bar mounted on an outer surface of the bus bar frame; and an inner cover provided with a plate portion located on an outer side of the cell assembly, formed in a plate shape and formed with a chamfer on an outer peripheral portion and a coupling portion coupled to one end portion of the body portion of the bus bar frame on a part of the outer peripheral portion of the plate portion.

Abstract: Provided are nanoparticles for sensing phosphate, a method for manufacturing the same, and a membrane for sensing phosphate including the same. The nanoparticles for sensing phosphate include a coordination polymer in which lanthanide metal ions and ligands are coordinated, and a polymer.

Abstract: An atmospheric pressure plasma device is disclosed. The atmospheric pressure plasma device includes a conductive tube connected to a power device, an electrode formed as a plate and receiving power supplied from the conductive tube and a dielectric configured to control discharge instability by being formed to surround a side surface of the electrode.

Abstract: An atmospheric pressure plasma device is disclosed. The atmospheric pressure plasma device includes a conductive tube connected to a power device, an electrode formed as a plate and receiving power supplied from the conductive tube and a dielectric configured to control discharge instability by being formed to surround a side surface of the electrode.

Abstract: An electronic device including a transparent and flexible mica substrate and a method of manufacturing the electronic device are provided, in which the method includes forming an organic or inorganic layer on the mica substrate and thermally processing the mica substrate at a temperature of 200° C. or greater.

Abstract: A method of controlling a laser beam annealing apparatus to manufacture a thin film transistor substrate, the method including: irradiating a laser beam emitted from a laser beam irradiator onto an amorphous silicon layer on a substrate supported by a substrate support; obtaining photographic data with respect to at least a part of the substrate by using a photographic unit; and adjusting a position of at least one of the substrate support or the laser beam irradiator by using a position adjuster based on the photographic data obtained by the photographic unit.

Abstract: An apparatus for inspecting crystallization includes a substrate including a semiconductor layer, the semiconductor layer includes a plurality of crystallized regions separated from each other; a stage configured to change a position of the substrate, the substrate being seated thereon; a photographing unit configured to acquire image data regarding the semiconductor layer; an inspection unit configured to obtain inspection data regarding the semiconductor layer; and a control unit configured to output change data regarding a change in the position of the substrate according to the image data acquired by the photographing unit.

Abstract: A laser apparatus includes: a laser which selectively irradiates a laser beam to a portion of a target based on a laser driving voltage, where an intensity of the laser beam is substantially stabilized within about 10 nanoseconds; a stage which controls a relative location between the target and the laser based on a stage driving voltage; and a controller which applies the stage driving voltage to the stage, and applies the laser driving voltage to the laser

Abstract: A laser beam annealing apparatus includes a substrate support configured to support a substrate on which a silicon layer is formed, a laser beam irradiator configured to irradiate a laser beam onto the silicon layer, a photographic unit configured to obtain data with respect to at least a part of the substrate, and a position adjuster configured to adjust a position of at least one of the substrate support or the laser beam irradiator based on the data obtained by the photographic unit.

Abstract: An apparatus for inspecting crystallization includes a substrate including a semiconductor layer, the semiconductor layer includes a plurality of crystallized regions separated from each other; a stage configured to change a position of the substrate, the substrate being seated thereon; a photographing unit configured to acquire image data regarding the semiconductor layer; an inspection unit configured to obtain inspection data regarding the semiconductor layer; and a control unit configured to output change data regarding a change in the position of the substrate according to the image data acquired by the photographing unit.

Abstract: A quinolizine carboxylic acid derivative of formula (I) or a pharmaceutically acceptable salt thereof: wherein R1 and R2 have the same meanings the as defined in the specification.