Abstract: A stack type semiconductor memory device may include a first structure and a second structure. The first structure may include a first substrate, a capacitor array and a first bonding layer. The first substrate may have an upper surface and a lower surface. The capacitor array may include a plurality of capacitors integrated on the upper surface of the first substrate. The first bonding layer may be formed on the capacitor array. The second structure may include a second substrate, an access array and a second bonding layer. The second substrate may have an upper surface and a lower surface. The access array may include a plurality of access transistors integrated on the upper surface of the second substrate. The second bonding layer may be formed on the lower surface of the second substrate. The second bonding layer may be hybrid-bonded to the first bonding layer.

Abstract: A semiconductor device and a method for fabricating the same are provided. The semiconductor device includes a first semiconductor structure including a cell region and a peripheral circuit region, and including a cell capacitor disposed in the cell region and a first insulating layer disposed in the cell region and the peripheral circuit region to cover the cell capacitor; a second semiconductor structure including a cell transistor disposed over the first insulating layer in the cell region and a peripheral circuit transistor disposed over the first insulating layer in the peripheral circuit region; and a first conductor passing through the first insulating layer to electrically connect a first cell source/drain region of the cell transistor and an electrode of the cell capacitor.

Abstract: A semiconductor device and a method for fabricating the same are provided. The semiconductor device includes a semiconductor pattern; an impurity region disposed at a side of the semiconductor pattern and having a lower surface that forms a flat surface with a lower surface of the semiconductor pattern; a gate structure disposed under the semiconductor pattern; and a contact plug disposed over the impurity region and electrically connected to the impurity region.

Abstract: The present disclosure provides a glass antenna structure including: a glass sheet provided in a vehicle; a monopole antenna unit located on one surface of the glass sheet; a plurality of rectangular patch planes located on another surface of the glass sheet at a position corresponding to the monopole antenna unit; and a co-planar waveguide (CPW) feeding line in contact with one end of the monopole antenna unit.

Abstract: The present disclosure provides a glass antenna structure including: a glass sheet provided in a vehicle; a monopole antenna unit located on one surface of the glass sheet; a plurality of rectangular patch planes located on another surface of the glass sheet at a position corresponding to the monopole antenna unit; and a co-planar waveguide (CPW) feeding line in contact with one end of the monopole antenna unit.

Abstract: A laminated glass antenna structure includes an upper glass located at the outermost position of a vehicle, a patch radiation unit located in at least a portion of the rear surface of the upper glass, and a lower glass located on the rear surface of the patch radiation unit. In particular, the patch radiation unit includes a strip line located in a height direction of the patch radiation unit, at least one extension line extending in the lateral direction of the strip line, and a patch element located at the end of the extension line.

Abstract: A single glass antenna structure includes a glass that is disposed on a vehicle and a plurality of monopole antenna units that are disposed on one surface of the glass to be adjacent to each other. Each of the monopole antenna units includes a transmission line extending in a first direction of the glass and at least one monopole device located along the transmission line.

Abstract: A reserved recording method and apparatus of broadcast programs are disclosed. In setting reserved recording for broadcast programs, a start complementary time (SCT) and/or an end complementary time (ECT) are additionally set before a start time and after an end time of the broadcast programs, and if the SCT or a start time of a second broadcast program is ahead of the ECT of a first broadcast program, a switching time from the recording of the first broadcast program to the recording of the second broadcast program can be changed. Thus, a failure to record a portion of a broadcast program previously reserved for recording due to a delay in a broadcast time or the like can be prevented.

Abstract: Provided is an optical microscope system for detecting nanowires to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires and including: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera. Intensity of reflected light varies, due to optical anisotropy of the nanowires, along a polarizing orientation of light incident on the nanowires.

Abstract: A photolithography system using an optical microscope is provided that can form various types of selective patterns at a low cost in small-scale research using unit-size silicon substrates which is not targeted for mass production, without requiring an expensive photomask.

Abstract: Provided is an optical microscope system for detecting nanowires that is designed with a rotational polarizer and Fast Fourier Transform (FFT) to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires. The optical microscope system includes: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera.