Abstract: A microscopy method, and a microscope for carrying out the method, in which an illumination radiation is directed through an object arranged in an object plane of a microscope, in order to image the object, image data of a first image of the object being acquired with a first configuration of the microscope and image data of a second image of the object being acquired with a second configuration of the microscope. Differences between the image data of the first image and the second image are determined and, in dependence on the determined differences, image data of a contrast image of the object is provided.

Abstract: A microscope for high-resolution imaging of a sample in a depth direction and transversely thereto has an excitation beam path for illuminating a sample,—an imaging beam path with an objective and two detectors,—and a phase element. The phase element is situated in a pupil of the imaging beam path and has a different influence on two halves of the pupil cross section. The imaging beam path is split into two partial imaging beam paths downstream of the pupil as seen in the imaging direction, which partial imaging beam paths each lead to one of the two detectors. The two partial imaging beam paths have imaging lengths that differ by a specific wavelength difference such that the two detectors record images of the sample from two different focal planes, which are spaced apart by a distance in the depth direction.

Abstract: An optical arrangement for positioning in a beam path of a light microscope, has an optical carrier, on which a first set of optical assemblies for generating structured illumination light of different orientations is arranged. The optical arrangement includes an adjustable deflection device provided for selectably deflecting a light beam to one of the optical assemblies and for deflecting one light beam coming from said optical assembly into the direction of a sample that is to be examined. The invention further relates to a light microscope having an optical arrangement according to the invention.

Abstract: The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver.