Patents by Inventor Drew HOELSCHER

Drew HOELSCHER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10417533
    Abstract: Techniques include systems, computerized methods, and computer readable media for choosing placement of three-dimensional (3D) probes used for evaluating a 3D alignment pose of a runtime 3D image inside a 3D alignment system for estimating the pose of a trained 3D model image in that 3D runtime image. A plurality of features associated with a first plurality of points of interest from a 3D image are generated, wherein each feature includes data indicative of 3D properties of an associated point from the plurality of points of interest. A second plurality of points of interest are selected from among the first plurality of points of interest, based at least in part on the plurality of features associated with the first plurality of points of interest. Placements of a plurality of 3D probes are determined based at least in part on the second plurality of points of interest.
    Type: Grant
    Filed: August 9, 2016
    Date of Patent: September 17, 2019
    Assignee: Cognex Corporation
    Inventors: Simon Barker, Drew Hoelscher
  • Publication number: 20180046885
    Abstract: Techniques include systems, computerized methods, and computer readable media for choosing placement of three-dimensional (3D) probes used for evaluating a 3D alignment pose of a runtime 3D image inside a 3D alignment system for estimating the pose of a trained 3D model image in that 3D runtime image. A plurality of features associated with a first plurality of points of interest from a 3D image are generated, wherein each feature includes data indicative of 3D properties of an associated point from the plurality of points of interest. A second plurality of points of interest are selected from among the first plurality of points of interest, based at least in part on the plurality of features associated with the first plurality of points of interest. Placements of a plurality of 3D probes are determined based at least in part on the second plurality of points of interest.
    Type: Application
    Filed: August 9, 2016
    Publication date: February 15, 2018
    Inventors: Simon BARKER, Drew HOELSCHER