Patents by Inventor Dror Francis

Dror Francis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150201119
    Abstract: A native AFDX camera captures images and video under control, and in communication with, one or more AFDX networks. The system facilitates deployment of an image capture device on an AFDX network, including native (embedded) AFDX bi-directional ring support, eliminating the need for a separate legacy adapter, the accompanying additional wiring and interconnect complexity. Thus the complexity, weight, and power consumption is reduced, as compared to conventional camera deployments.
    Type: Application
    Filed: January 13, 2015
    Publication date: July 16, 2015
    Inventors: Ofer REICH, Uri GORIN, Dror FRANCIS, Yaron FINEGOLD
  • Patent number: 8045786
    Abstract: Disclosed are apparatus and methods for optimizing a metrology tool, such as an optical or scanning electron microscope so that minimum human intervention is achievable during the optimization. In general, a set of specifications and an initial input data are initially provided for a particular target. The specifications provide limits for characteristics of images that are to be measured by the metrology tool. The metrology tool is then automatically optimized for measuring the particular target so as to meet one or more of the provided specifications without further significant human intervention with respect to the metrology tool. In one aspect, the input data provided prior to the automated optimization procedure includes a plurality of target locations and a synthetic image of the particular target.
    Type: Grant
    Filed: October 24, 2006
    Date of Patent: October 25, 2011
    Assignee: KLA-Tencor Technologies Corp.
    Inventors: Amir Widmann, Mark Ghinovker, Dror Francis
  • Publication number: 20080094639
    Abstract: Disclosed are apparatus and methods for optimizing a metrology tool, such as an optical or scanning electron microscope so that minimum human intervention is achievable during the optimization. In general, a set of specifications and an initial input data are initially provided for a particular target. The specifications provide limits for characteristics of images that are to be measured by the metrology tool. The metrology tool is then automatically optimized for measuring the particular target so as to meet one or more of the provided specifications without further significant human intervention with respect to the metrology tool. In one aspect, the input data provided prior to the automated optimization procedure includes a plurality of target locations and a synthetic image of the particular target.
    Type: Application
    Filed: October 24, 2006
    Publication date: April 24, 2008
    Inventors: Amir Widmann, Mark Ghinovker, Dror Francis