Patents by Inventor Duane E. Meyer

Duane E. Meyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220244169
    Abstract: Ellipsometer, polarimeter, reflectometer and spectrophotometer systems including one or more wavelength modifiers which convert wavelengths provided by a source of electromagnetic radiation to different wavelengths for use in investigating a sample, and/or which a detector thereof can detect.
    Type: Application
    Filed: September 16, 2021
    Publication date: August 4, 2022
    Applicant: J.A. WOOLLAM CO., INC.
    Inventors: Ping He, Martin M. Liphardt, Jeremy A. Van Derslice, Craig M. Herzinger, Jeffrey S. Hale, Brian D. Guenther, Duane E. Meyer, Stefan Schoeche, James D. Welch
  • Patent number: 10338362
    Abstract: In ellipsometer and polarimeter systems, reflective optics including both convex and a concave mirrors that have beam reflecting surfaces, as well as aperture control of beam size to optimize operation with respect to aberration and diffraction effects while achieve the focusing of a beam of electromagnetic radiation with minimized effects on a polarization state of an input beam state of polarization that results from adjustment of angles of incidence and reflections from the various mirrors involved, and further including detectors of electromagnetic radiation that enable optimization of the operation thereof for application over various specific wavelength ranges, involving functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics.
    Type: Grant
    Filed: July 3, 2018
    Date of Patent: July 2, 2019
    Assignee: J.A. WOOLLAM CO., INC.
    Inventors: Martin M. Liphardt, Jeffrey S. Hale, Ping He, Galen L. Pfeiffer, Duane E. Meyer
  • Patent number: 10247611
    Abstract: Application of detectors of electromagnetic radiation and systems for enabling the optimization thereof for application over various specific wavelength ranges, involving functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics.
    Type: Grant
    Filed: December 14, 2015
    Date of Patent: April 2, 2019
    Assignee: J.A. WOOLIAM CO., INC.
    Inventors: Martin M. Liphardt, Ping He, Duane E. Meyer
  • Patent number: 8462341
    Abstract: A system, method of configuring, and application a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
    Type: Grant
    Filed: March 14, 2011
    Date of Patent: June 11, 2013
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Ping He, Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
  • Publication number: 20110188040
    Abstract: A system, method of configuring, and application a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
    Type: Application
    Filed: March 14, 2011
    Publication date: August 4, 2011
    Inventors: Ping He, Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
  • Patent number: 7907280
    Abstract: A method of configuring a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
    Type: Grant
    Filed: November 4, 2008
    Date of Patent: March 15, 2011
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
  • Publication number: 20090091758
    Abstract: A method of configuring a system for introducing a relative phase retardation into orthogonally polarized components of an electromagnetic beam entered thereinto, wherein the system involves a substantially achromatic multiple element retarder system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems.
    Type: Application
    Filed: November 4, 2008
    Publication date: April 9, 2009
    Inventors: Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer, Martin M. Liphardt
  • Patent number: 7460230
    Abstract: A substantially achromatic multiple element compensator system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems. Multiple total internal reflections enter retardance into an entered beam of electromagnetic radiation, and the elements are oriented to minimize changes in the net retardance vs. the input beam angle resulting from changes in the position and/or rotation of the system of elements.
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: December 2, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer
  • Patent number: 7450231
    Abstract: A substantially achromatic multiple element compensator system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems. Multiple total internal reflections enter retardance into an entered beam of electromagnetic radiation, and the elements are oriented to minimize changes in the net retardance vs. the input beam angle resulting from changes in the position and/or rotation of the system of elements.
    Type: Grant
    Filed: December 4, 2006
    Date of Patent: November 11, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer
  • Publication number: 20080100842
    Abstract: A substantially achromatic multiple element compensator system for use in wide spectral range (for example, 190-1700 nm) rotating compensator spectroscopic ellipsometer and/or polarimeter systems. Multiple total internal reflections enter retardance into an entered beam of electromagnetic radiation, and the elements are oriented to minimize changes in the net retardance vs. the input beam angle resulting from changes in the position and/or rotation of the system of elements.
    Type: Application
    Filed: December 4, 2006
    Publication date: May 1, 2008
    Inventors: Blaine D. Johs, Steven E. Green, Craig M. Herzinger, Duane E. Meyer
  • Patent number: 7345762
    Abstract: Disclosed are system for and method of analyzing substantially the exact same spot size on a sample system with at least two wavelengths for which the focal lengths do not vary more than within an acceptable amount.
    Type: Grant
    Filed: August 15, 2005
    Date of Patent: March 18, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Martin M. Liphardt, Blaine D. Johs, John A. Woollam, Duane E. Meyer, James D. Welch
  • Patent number: 6982789
    Abstract: A monochromator system applicable in spectrophotometer, polarimeter and ellipsometer systems which operate over a large range of wavelengths, including a stage which enables position adjustment of the location of a source of electromagnetic radiation in lateral (X), longitudinal (Y) and vertical (Z) directions, from a common location outside an enclosure, and including multiple detector systems mounted in a manner which allows easily, sequentially, via mechanical motion, placing a first and then a second thereof so as to receive a beam of electromagnetic radiation.
    Type: Grant
    Filed: August 8, 2003
    Date of Patent: January 3, 2006
    Assignee: J.A. Woollam Co. Inc.
    Inventor: Duane E. Meyer
  • Patent number: 5661589
    Abstract: A system for translating applied linear motion into a slit width present between facing edges of two "Knife-blade" elements. In its preferred embodiment, two slide assemblies are firmly affixed to a frame such that loci of motion of slide elements thereof form an acute angle therebetween. Lower ends of each slide element, as viewed in vertically oriented frontal elevation, allow horizontal motion therebetween when said slide element lower ends are caused to simultaneously move vertically. An alternative embodiment provides that the slide elements be oriented such that said loci of motion of said slide elements are, for instance, horizontally directed. In its preferred embodiment the simultaneous motion of the slide elements is effected by a motor, preferably a precisely controlled computer driven stepper motor, which motor causes a threaded shaft therein to move vertically as a result of screw thread translation of motor imparted rotational motion to said threaded shaft.
    Type: Grant
    Filed: February 24, 1995
    Date of Patent: August 26, 1997
    Assignee: J. A. Woollam Co. Inc.
    Inventor: Duane E. Meyer