Patents by Inventor Duane M. Courtney

Duane M. Courtney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6724487
    Abstract: Apparatus for measuring the surface profile of a sample, includes a fixture for locating a surface of a transparent optical flat relative to a surface of a sample; a low-coherence light interferometer having an optical probe coupled to an XY scanning frame for scanning the surface of the sample through the transparent optical flat to produce interferometric data signals representing the distances between the optical flat surface and the surface of the sample; and a computer system responsive to the interferometric data signals for generating a surface profile of the sample using a best fit to a plane.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: April 20, 2004
    Assignee: Eastman Kodak Company
    Inventors: Michael A. Marcus, Thomas F. Kaltenbach, Duane M. Courtney, Jiann-Rong Lee
  • Publication number: 20030227632
    Abstract: Apparatus for measuring the surface profile of a sample, includes a fixture for locating a surface of a transparent optical flat relative to a surface of a sample; a low-coherence light interferometer having an optical probe coupled to an XY scanning frame for scanning the surface of the sample through the transparent optical flat to produce interferometric data signals representing the distances between the optical flat surface and the surface of the sample; and a computer system responsive to the interferometric data signals for generating a surface profile of the sample using a best fit to a plane.
    Type: Application
    Filed: June 6, 2002
    Publication date: December 11, 2003
    Applicant: Eastman Kodak Company
    Inventors: Michael A. Marcus, Thomas F. Kaltenbach, Duane M. Courtney, Jiann-Rong Lee