Patents by Inventor Duane P. Littlejohn

Duane P. Littlejohn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6608304
    Abstract: A mass spectrometer (MS) which uses the Fourier transform ion cyclotron resonance (FTICR) technique to determine the mass of ions. The MS is prepared with a surface that guarantees that a particle striking the surface will have at least one contact with the cathode and will most likely be re-pumped before escaping into the vacuum chamber volume.
    Type: Grant
    Filed: October 2, 2000
    Date of Patent: August 19, 2003
    Assignee: Siemens Energy & Automation
    Inventors: Duane P. Littlejohn, Thomas Knudsen
  • Patent number: 6498344
    Abstract: A mass spectrometer (MS) which uses the Fourier transform ion cyclotron resonance (FTICR) technique to determine the mass of ions. The MS is prepared with a surface that guarantees that a particle striking the surface will have at least one contact with the cathode and will most likely be re-pumped before escaping into the vacuum chamber volume.
    Type: Grant
    Filed: October 2, 2000
    Date of Patent: December 24, 2002
    Assignee: Siemens Energy & Automation, Inc.
    Inventor: Duane P. Littlejohn
  • Patent number: 6355929
    Abstract: A method for forming the seat in a pulsed sampling valve used in a FTICR MS. The valve has a ceramic ball that closes against the seat to thereby seal the passageway that is used for introduction of sample into the FTICR MS vacuum chamber. The material from which the seat is formed is chosen to withstand relatively high operating temperatures and a precise deburred hole is drilled in that material. The pre-load spring exerts a force against the ball when the valve is assembled. The force initially exceeds the yield strength of the seat material to deform the material to form the seat.
    Type: Grant
    Filed: October 16, 1998
    Date of Patent: March 12, 2002
    Assignee: Siemens Energy & Automation, Inc.
    Inventors: Duane P. Littlejohn, W. Peter Schubert
  • Patent number: 6255648
    Abstract: A quantity of electrons that will be used in the ionization event in an FTICR MS is preprogrammed. When the number of electrons produced reaches that number, the electron beam is turned off. This approach assures that the same number of electrons are used for every measurement and eliminates the variations due to fundamental characteristics of the electron sourcere and the variations in temperature due to changing ambient conditions.
    Type: Grant
    Filed: October 16, 1998
    Date of Patent: July 3, 2001
    Assignee: Applied Automation, Inc.
    Inventors: Duane P. Littlejohn, Robert W. Arnold
  • Patent number: 6232599
    Abstract: A relay control for an ion pump used in a FTICR MS. When it is desired to admit new sample gas into the vacuum system, the high voltage that powers the ion pump is removed from the pump electrode by opening the normally closed relay contact. A normally open contact relay contact is then closed to ground the pump electrode and discharge any stray capacity. The sample valve is opened momentarily to admit new sample gas and after the ions are formed and trapped in the ion cell in the vacuum system the pump is restarted.
    Type: Grant
    Filed: October 16, 1998
    Date of Patent: May 15, 2001
    Assignee: Siemens Aktiengesellschaft
    Inventor: Duane P. Littlejohn
  • Patent number: 6225624
    Abstract: During operation of a FTICR MS the time after the opening of the pulsed valve sample gas inlet system that the peak of sample gas pressure occurs in the vacuum chamber is determined by measuring the amplitude of the ion pump current. The FTICR MS then uses that time and the known period of time for which a source of electrons used for an ionization event is energized to energize the electron source so that the known period of time includes the peak of vacuum chamber sample gas pressure. This allows ions to be created during the peak of the sample gas pressure to thereby obtain the maximum sensitivity during measurements.
    Type: Grant
    Filed: October 16, 1998
    Date of Patent: May 1, 2001
    Assignee: Siemens Aktiengesellschaft
    Inventors: Duane P. Littlejohn, Robert W. Arnold
  • Patent number: 6121609
    Abstract: The closure of a leak valve in a pulsed mass spectrometer is controlled to thereby substantially extend the life of the valve. An actuator responds to a pulse to open the valve. At the end of the open period the element that closes the valve seat is allowed to travel a substantial distance from the open position of the element to the nearly closed position of the element. The pulse amplitude is then controlled so that the time for the element to travel the remaining distance to valve seat closure is extended in time. The pulse amplitude can also be controlled so that the valve will never close except under fault conditions where power is lost or in a non-operating mode.
    Type: Grant
    Filed: October 16, 1998
    Date of Patent: September 19, 2000
    Assignee: Siemens Aktiengesellschaft
    Inventor: Duane P. Littlejohn
  • Patent number: 5233190
    Abstract: A molecular spectrometer is provided that performs Fourier analysis utilizing the discrete Fourier Transform on a digitized time domain waveform that relates to the composition of a sample. Digitized reference waveforms are employed to permit the instrument to limit its analysis to frequencies of interest and thereby increase the rapidity of the analysis. Data at differing frequencies can be resolved at independent resolutions, and the instrument can analyze spectroscopic data in real time.
    Type: Grant
    Filed: November 22, 1991
    Date of Patent: August 3, 1993
    Assignee: Leybold Inficon Inc.
    Inventors: Fritz H. Schlereth, Duane P. Littlejohn, James E. Phillips
  • Patent number: 4739165
    Abstract: A remote ion source within an ICR mass spectrometer which provides an enhanced trapping (within an analyzer cell) of ions formed within that remote ion source. In a preferred embodiment, trapping enhancement is accomplished by means of magnetic perturbations of the magnetic field within the analyzer cell. The perturbations may be established by ferromagnetic means or electromagnetic means or by the use of permanent magnets to form a magnetic bottle. Ions formed within the remote ion source are extracted from that source by an electrostatic lens and directed toward the analyzer cell along the Z axis of the spectrometer magnetic field. Deceleration lenses, external to the analyzer cell, may be employed to further enhance the trapping capability of the analyzer cell. In some modes of operation, a ramped deceleration potential may be applied to the declaration lens for "grouping" of ions of different masses for analysis. Provision for mass selection is also made within the spectrometer disclosed herein.
    Type: Grant
    Filed: February 27, 1986
    Date of Patent: April 19, 1988
    Assignee: Nicolet Instrument Corporation
    Inventors: Sahba Ghaderi, Othman Vosburger, Duane P. Littlejohn, Juda L. Shohet
  • Patent number: 4668864
    Abstract: A mass spectrometer of the type wherein a solenoidal magnet produces a magnetic field that includes a region along its geometric central axis. That region is a region of high field intensity and high homogeneity with magnetic flux lines in the region being generally parallel to the magnet central axis. A high vacuum is established in the region and a sample cell is positioned at or within the region in which sample ions are formed, trapped, excited and detected. An ionizing device is positioned outside of the region and off the central axis while an additional ionizing device may be positioned on the central axis. In a preferred embodiment, the off axis ionizing device may be supported for movement relative to the central axis. A preferred ionizing device for the off axis device is an electron gun.
    Type: Grant
    Filed: August 22, 1984
    Date of Patent: May 26, 1987
    Assignee: Nicolet Instrument Corporation
    Inventors: Sahba Ghaderi, Duane P. Littlejohn
  • Patent number: 4588888
    Abstract: A mass spectrometer of the type wherein the sample is ionized, excited into resonance and detected within a generally homogeneous magnetic field. During detection, the magnetic field is perturbed to form magnetic mirror regions to contain the ions. Prior to detection, the ions may be contained by conventional trapping techniques or by magnetic reflection.
    Type: Grant
    Filed: February 11, 1985
    Date of Patent: May 13, 1986
    Assignee: Nicolet Instrument Corporation
    Inventors: Sahba Ghaderi, Juda L. Shohet, Duane P. Littlejohn
  • Patent number: 4581533
    Abstract: A mass spectrometer including a vacuum chamber wherein molecular flow conditions are maintained. A sample introduced into the chamber is ionized while a magnetic field through the chamber induces ion cyclotron resonance. Trapping plates are provided for restricting ion movement along the magnetic field while a conductance limit plate divides the chamber into first and second compartments. The conductance limit plate has an orifice configured to allow ion equilibration between the compartments while maintaining a pressure differential between them. The conductance limit plate includes an electrode that is selectively connected to a means for applying trapping potential to selectively trap ions in one of said compartments.
    Type: Grant
    Filed: May 15, 1984
    Date of Patent: April 8, 1986
    Assignee: Nicolet Instrument Corporation
    Inventors: Duane P. Littlejohn, Sahba Ghaderi