Abstract: One or more example embodiments of the present invention relates to a system for detection of x-ray radiation. The system comprises photon-counting x-ray CT scanners and associated edge devices. Each edge device determines a quality indicator indicative of a quality of the sensor data based on scanner data. Further, each edge device generates a parameterized machine learning model by optimizing the quality indicator. A server device receives the generated parameterized machine learning models from the edge devices, aggregates the parameterized machine learning models into an aggregated parameterized machine learning model, and sends at least part of the aggregated parameterized machine learning model back to the edge devices.