Abstract: Systems and methods for determining the resonant frequencies of at least one axis of a two-axis resonant light scanner based on a measured resistance of at least a portion of one of the axes are disclosed. Precise knowledge of the resonant frequencies of each axis enables quasi-closed-loop operation of a light scanner, wherein the resonant frequencies of its axes can be periodically updated to ensure the proper drive frequencies are used. Furthermore, by determining the relationship between the measured resistance and scanner angle, calibration of the scanner is facilitated and even enabled at the wafer level during fabrication. In some cases, it also enables real-time monitoring of scanner position. Scanners in accordance with the present disclosure are suitable for use in any application that requires one or more reflective elements that can be scanned or steered in at least one dimension.

Abstract: Systems and methods for monitoring the instantaneous position of a scanning element of a light scanner via an optical-feedback signal are disclosed, where the optical-feedback signal is a portion of a light signal being steered in a two-dimensional pattern by the light scanner. The optical-feedback signal is detected by a position monitor that provides a commensurate feedback signal. In some embodiments, the feedback signal is used to develop a transfer function for the light scanner via a calibration routine. In some embodiments, the feedback signal is used in a closed-loop driving scheme used to drive the light scanner. Embodiments in accordance with the present disclosure are particularly well suited for use in object tracking systems, such as eye trackers.

Abstract: Systems and methods for determining the resonant frequencies of at least one axis of a two-axis resonant light scanner based on a measured resistance of at least a portion of one of the axes are disclosed. Precise knowledge of the resonant frequencies of each axis enables quasi-closed-loop operation of a light scanner, wherein the resonant frequencies of its axes can be periodically updated to ensure the proper drive frequencies are used. Furthermore, by determining the relationship between the measured resistance and scanner angle, calibration of the scanner is facilitated and even enabled at the wafer level during fabrication. In some cases, it also enables real-time monitoring of scanner position. Scanners in accordance with the present disclosure are suitable for use in any application that requires one or more reflective elements that can be scanned or steered in at least one dimension.

Abstract: The present disclosure is directed to compact packaging for optical MEMS devices, such as one- and two-dimensional light scanners. An embodiment in accordance with the present disclosure includes a housing having a chamber for holding a light source and a MEMS scanner. The MEMS scanner receives light from the light source via an optical element disposed on a cover of the housing and steers an output signal along a propagation direction through the cover while steering the output signal in at least one dimension.

Abstract: The present disclosure is directed to compact packaging for optical MEMS devices, such as one- and two-dimensional beam scanners. An embodiment in accordance with the present disclosure includes a light source and a MEMS-based scanning element for steering at least a portion of the light provided by the light source in at least one dimension as an output light signal, as well as one or more optical elements for collimating and/or redirecting light within a sealed chamber defined by the elements of a housing. In some embodiments, the one or more optical elements include a reflective lens that collimates the light provided by the light source while simultaneously correcting phase-front error imparted by the scanning element while steering the output beam.

Abstract: The present disclosure is directed to compact packaging for optical MEMS devices, such as one- and two-dimensional beam scanners. An embodiment in accordance with the present disclosure includes a light source and a MEMS-based scanning element for steering at least a portion of the light provided by the light source in at least one dimension as an output light signal, as well as one or more optical elements for collimating and/or redirecting light within a sealed chamber defined by the elements of a housing. In some embodiments, the one or more optical elements include a reflective lens that collimates the light provided by the light source while simultaneously correcting phase-front error imparted by the scanning element while steering the output beam.

Abstract: A single-chip scanning probe microscope is disclosed, wherein the microscope includes an isothermal two-dimensional scanner and a cantilever that includes an integrated strain sensor and a probe tip. The scanner is operative for scanning a probe tip about a scanning region on a sample while the sensor measures tip-sample interaction forces. The scanner, cantilever, probe tip, and integrated sensor can be fabricated using the backend processes of a conventional CMOS fabrication process. In addition, the small size of the microscope system, as well as its isothermal operation, enable arrays of scanning probe microscopes to be integrated on a single substrate.

Abstract: A single-chip scanning probe microscope is disclosed, wherein the microscope includes an isothermal two-dimensional scanner and a cantilever that includes an integrated strain sensor and a probe tip. The scanner is operative for scanning a probe tip about a scanning region on a sample while the sensor measures tip-sample interaction forces. The scanner, cantilever, probe tip, and integrated sensor can be fabricated using the backend processes of a conventional CMOS fabrication process. In addition, the small size of the microscope system, as well as its isothermal operation, enable arrays of scanning probe microscopes to be integrated on a single substrate.