Abstract: A system and method is disclosed for testing components used in the manufacture of information handling systems. In embodiments of the invention, a device-under-test (DUT) comprises a DUT identifier code. The DUT is operably coupled to a test bed. An information handling system is operable to use the identifier code to select and execute a predetermined test program to generate a plurality of test commands. A test bed interface is operable to receive the test commands and to generate a plurality of test control signals therefrom to perform a predetermined set of tests of said DUT.