Patents by Inventor Duy Duc LE

Duy Duc LE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for estimating twin defect density
    Patent number: 11733177
    Abstract: Disclosed is a method for estimating twin defect density in a single-crystal sample, including: (A) etching the observed surface of a single crystal to form etch pits; (B) selecting bar-shaped etch pits caused by twin defect; (C) from the long-axis direction lengths of the etch pits caused by twin defect, estimating the twin defect density by using the following equation: twin defect density=?kx?i/area of sample, wherein 2?k?3, and x?i is the long-axis direction length of an etch pit caused by the i-th twin.
    Type: Grant
    Filed: March 11, 2020
    Date of Patent: August 22, 2023
    Assignee: The Industry & Academic Cooperation in Chungnam National University (IAC)
    Inventors: Soon-ku Hong, Si Trong Ngo, Duy Duc Le, Jungkuk Lee
  • METHOD FOR ESTIMATING TWIN DEFECT DENSITY
    Publication number: 20210270753
    Abstract: Disclosed is a method for estimating twin defect density in a single-crystal sample, including: (A) etching the observed surface of a single crystal to form etch pits; (B) selecting bar-shaped etch pits caused by twin defect; (C) from the long-axis direction lengths of the etch pits caused by twin defect, estimating the twin defect density by using the following equation: twin defect density=?kx?i/area of sample, wherein 2?k?3, and x?i is the long-axis direction length of an etch pit caused by the i-th twin.
    Type: Application
    Filed: March 11, 2020
    Publication date: September 2, 2021
    Applicant: The Industry & Academic Cooperation in Chungnam National University (IAC)
    Inventors: Soon-ku HONG, Si Trong NGO, Duy Duc LE, Jungkuk LEE