Patents by Inventor Dwight A. Sehler
Dwight A. Sehler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8427642Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.Type: GrantFiled: February 14, 2012Date of Patent: April 23, 2013Assignee: Particle Measuring Systems, Inc.Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Karen R. Sandberg
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Publication number: 20120140223Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.Type: ApplicationFiled: February 14, 2012Publication date: June 7, 2012Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: John MITCHELL, Dwight A. SEHLER, Michael WILLIAMSON, David RICE, Jon SANDBERG, Karen R. SANDBERG
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Patent number: 8174697Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.Type: GrantFiled: September 26, 2011Date of Patent: May 8, 2012Assignee: Particle Measuring Systems, Inc.Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, legal representative, Dwight A. Sehler
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Patent number: 8154724Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.Type: GrantFiled: December 2, 2008Date of Patent: April 10, 2012Assignee: Particle Measuring Systems, Inc.Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Jon Sandberg, Karen R. Sandberg, legal representative
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Publication number: 20120012757Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.Type: ApplicationFiled: September 26, 2011Publication date: January 19, 2012Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: John MITCHELL, Jon SANDBERG, Karen R. Sandberg, Dwight A. Sehler
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Patent number: 8027035Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.Type: GrantFiled: March 8, 2011Date of Patent: September 27, 2011Assignee: Particle Measuring Systems, Inc.Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, Legal Representative, Dwight A. Sehler
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Publication number: 20110155927Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.Type: ApplicationFiled: March 8, 2011Publication date: June 30, 2011Applicant: Particle Measuring Systems, Inc.Inventors: John MITCHELL, Jon Sandberg, Dwight A. Sehler, Karen R. Sandberg
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Patent number: 7916293Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.Type: GrantFiled: December 2, 2008Date of Patent: March 29, 2011Assignee: Particle Measuring Systems, Inc.Inventors: John Mitchell, Jon Sandberg, Karen R. Sandberg, legal representative, Dwight A. Sehler
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Publication number: 20090244536Abstract: The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.Type: ApplicationFiled: December 2, 2008Publication date: October 1, 2009Inventors: John Mitchell, Dwight A. Sehler, Michael Williamson, David Rice, Jon Sandberg, Karen R. Sandberg
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Publication number: 20090219530Abstract: Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.Type: ApplicationFiled: December 2, 2008Publication date: September 3, 2009Inventors: John Mitchell, Jon Sandberg, David A. Turner, Dwight A. Sehler
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Publication number: 20090190128Abstract: A particle counter for optically detecting an unconstrained particle of less than one micron in size suspended in a flowing liquid includes a sample chamber having a fluid inlet and a fluid outlet; a laser module producing a laser beam; a beam shaping optical system providing a multiple laser beam pattern in the sample chamber; and a CMOS optical detector located to detect light scattered by the particles in the sample chamber. The particle counter has a particle sensing area within the sample chamber in which the intensity of light is at least 10 Watts/mm2, the sensing area having an area of 0.5 square mm or more. The detector has thirty or more detector array elements. In the preferred embodiment, the laser optical system reflects and refocuses the laser beam to effect multiple passes of the same laser beam through the sensing area.Type: ApplicationFiled: November 24, 2008Publication date: July 30, 2009Applicant: PARTICLE MEASURING SYSTEMS, INC.Inventors: Todd A. CERNI, Dwight A. SEHLER
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Patent number: 7456960Abstract: A particle counter for optically detecting an unconstrained particle of less than one micron in size suspended in a flowing liquid includes a sample chamber having a fluid inlet and a fluid outlet; a laser module producing a laser beam; a beam shaping optical system providing a multiple laser beam pattern in the sample chamber, and a CMOS optical detector located to detect light scattered by the particles in the sample chamber. The particle counter has a particle sensing area within the sample chamber in which the intensity of light is at least 10 Watts/mm2, the sensing area having an area of 0.5 square mm or more. The detector has thirty or more detector array elements. In the preferred embodiment, the laser optical system reflects and refocuses the laser beam to effect multiple passes of the same laser beam through the sensing area.Type: GrantFiled: November 15, 2005Date of Patent: November 25, 2008Assignee: Particle Measuring Systems, Inc.Inventors: Todd A. Cerni, Dwight A. Sehler
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Patent number: 7030980Abstract: A fluid particle counter comprising an intracavity diode pumped solid state laser having a solid state lasing material having a non-reflective coating and a concave mirror having a reflective coating, with the coatings isolated from the sample flow by Brewster windows. The laser beam is apertured by an aperture assembly including an inner aperture closest to the inlet nozzle assembly and an outer aperture farther from the inlet nozzle assembly, with the outer aperture significantly farther from the inner aperture than the inner aperture is from the inlet nozzle assembly.Type: GrantFiled: December 29, 2004Date of Patent: April 18, 2006Assignee: Particle Measuring Systems, Inc.Inventors: Dwight A. Sehler, Todd A. Cerni
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Patent number: 6903818Abstract: An optical particle counter has a gain-apertured laser cavity producing laser light, an inlet jet providing fluid flow into a particle detecting region within the laser cavity, the inlet jet having an inlet jet orifice; a detection optics assembly located to collect light scattered from particles with the detecting region for producing an output signal indicative of the particles; and an optical barrier complex located to reduce noise as compared to the gain-apertured system without the optical barrier complex for fluid flow rates greater than or equal to about 0.1 cubic feet per minute. The optical barrier complex inhibits laser light from illuminating turbulent eddy currents originating on the interior walls of the inlet jet. The optical barrier complex includes one or more physical apertures, one or more optical stops, or both which are located to prevent laser light from illuminating the eddy currents.Type: GrantFiled: October 28, 2002Date of Patent: June 7, 2005Assignee: Particle Measuring Systems, Inc.Inventors: Todd A. Cerni, Dwight A. Sehler, Mark A. Lilly
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Publication number: 20040080747Abstract: An optical particle counter has a gain-apertured laser cavity producing laser light, an inlet jet providing fluid flow into a particle detecting region within the laser cavity, the inlet jet having an inlet jet orifice; a detection optics assembly located to collect light scattered from particles with the detecting region for producing an output signal indicative of the particles; and an optical barrier complex located to reduce noise as compared to the gain-apertured system without the optical barrier complex for fluid flow rates greater than or equal to about 0.1 cubic feet per minute. The optical barrier complex inhibits laser light from illuminating turbulent eddy currents originating on the interior walls of the inlet jet. The optical barrier complex includes one or more physical apertures, one or more optical stops, or both which are located to prevent laser light from illuminating the eddy currents.Type: ApplicationFiled: October 28, 2002Publication date: April 29, 2004Applicant: Particle Measuring Systems, Inc.Inventors: Todd A. Cerni, Dwight A. Sehler, Mark A. Lilly