Patents by Inventor Dylan Fashbaugh
Dylan Fashbaugh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11880028Abstract: A method for altering the intensity of light across the field of view of an image sensor in a microscope apparatus having a light source, an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor includes interposing a programmable spatial light modulator, pSLM, in the light path between the light source and the image sensor, the pSLM having a plurality of pixels; and modulating the intensity of light passing through one or more pixels of the plurality of pixels of the pSLM to produce an altered illumination landscape at the field of view of the image sensor that differs from an unaltered illumination landscape that would otherwise be produced at the image sensor. Vignetting can be specifically addressed.Type: GrantFiled: November 11, 2019Date of Patent: January 23, 2024Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer
-
Patent number: 11656429Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: GrantFiled: April 4, 2022Date of Patent: May 23, 2023Assignee: Nanotronics Imaging, Inc.Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Publication number: 20220229267Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: ApplicationFiled: April 4, 2022Publication date: July 21, 2022Applicant: Nanotronics Imaging, Inc.Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Patent number: 11294146Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: GrantFiled: December 16, 2019Date of Patent: April 5, 2022Assignee: Nanotronics Imaging, Inc.Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Patent number: 11099368Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: GrantFiled: June 29, 2020Date of Patent: August 24, 2021Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Publication number: 20200326519Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: ApplicationFiled: June 29, 2020Publication date: October 15, 2020Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Publication number: 20200264405Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: ApplicationFiled: December 16, 2019Publication date: August 20, 2020Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Patent number: 10698191Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: GrantFiled: June 29, 2018Date of Patent: June 30, 2020Assignee: NANOTRONICS IMAGING, INC.Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Publication number: 20200073108Abstract: A method for altering the intensity of light across the field of view of an image sensor in a microscope apparatus having a light source, an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor includes interposing a programmable spatial light modulator, pSLM, in the light path between the light source and the image sensor, the pSLM having a plurality of pixels; and modulating the intensity of light passing through one or more pixels of the plurality of pixels of the pSLM to produce an altered illumination landscape at the field of view of the image sensor that differs from an unaltered illumination landscape that would otherwise be produced at the image sensor. Vignetting can be specifically addressed.Type: ApplicationFiled: November 11, 2019Publication date: March 5, 2020Inventors: Matthew C. Putman, John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer
-
Patent number: 10509199Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: GrantFiled: February 13, 2019Date of Patent: December 17, 2019Assignee: Nanotronics Imaging, Inc.Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Patent number: 10502944Abstract: A method for altering the intensity of light across the field of view of an image sensor in a microscope apparatus having a light source, an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor includes interposing a programmable spatial light modulator, pSLM, in the light path between the light source and the image sensor, the pSLM having a plurality of pixels; and modulating the intensity of light passing through one or more pixels of the plurality of pixels of the pSLM to produce an altered illumination landscape at the field of view of the image sensor that differs from an unaltered illumination landscape that would otherwise be produced at the image sensor. Vignetting can be specifically addressed.Type: GrantFiled: October 2, 2017Date of Patent: December 10, 2019Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer
-
Publication number: 20190285835Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: ApplicationFiled: February 13, 2019Publication date: September 19, 2019Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Patent number: 10416426Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: GrantFiled: June 29, 2018Date of Patent: September 17, 2019Assignee: NANOTRONICS IMAGING, INC.Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Publication number: 20190101741Abstract: A method for altering the intensity of light across the field of view of an image sensor in a microscope apparatus having a light source, an image sensor having pixels, and a specimen stage, wherein light from the light source travels along a light path to the specimen stage and then to the image sensor includes interposing a programmable spatial light modulator, pSLM, in the light path between the light source and the image sensor, the pSLM having a plurality of pixels; and modulating the intensity of light passing through one or more pixels of the plurality of pixels of the pSLM to produce an altered illumination landscape at the field of view of the image sensor that differs from an unaltered illumination landscape that would otherwise be produced at the image sensor. Vignetting can be specifically addressed.Type: ApplicationFiled: October 2, 2017Publication date: April 4, 2019Inventors: Matthew C. Putman, John B. Putman, Dylan Fashbaugh, Roarke Horstmeyer
-
Patent number: 10247910Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.Type: GrantFiled: March 14, 2018Date of Patent: April 2, 2019Assignee: Nanotronics Imaging, Inc.Inventors: John B. Putman, Matthew C. Putman, Julie Orlando, Dylan Fashbaugh
-
Publication number: 20180335614Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: ApplicationFiled: June 29, 2018Publication date: November 22, 2018Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Publication number: 20180307016Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: ApplicationFiled: June 29, 2018Publication date: October 25, 2018Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Publication number: 20180231752Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: ApplicationFiled: May 16, 2017Publication date: August 16, 2018Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh
-
Patent number: 10048477Abstract: A microscope system and method allow for a desired x?-direction scanning along a specimen to be angularly offset from an x-direction of the XY translation stage, and rotates an image sensor associated with the microscope to place the pixel rows of the image sensor substantially parallel to the desired x?-direction. The angle of offset of the x?-direction relative to the x-direction is determined and the XY translation stage is employed to move the specimen relative to the image sensor to different positions along the desired x?-direction without a substantial shift of the image sensor relative to the specimen in a y?-direction, the y?-direction being orthogonal to the x? direction of the specimen. The movement is based on the angle of offset.Type: GrantFiled: May 16, 2017Date of Patent: August 14, 2018Assignee: NANOTRONICS IMAGING, INC.Inventors: Matthew C. Putman, John B. Putman, Brandon Scott, Dylan Fashbaugh