Abstract: A vacuum-application and coating apparatus for applying a protective coating to at least one ball-grid-array assembly is provided. The apparatus comprises an upper plate having at least one injection port forming the upper chamber wall, and a lower plate having at least one vacuum port forming the lower chamber wall of the vacuum-application and coating apparatus when assembled. A compliant layer of material is provided on the chamber-side surface of the upper plate and a sealing mechanism for enabling a vacuum seal is also provided. At least one ball-grid-array assembly is placed on the chamber surface of the lower plate during assembly of the vacuum-application and coating apparatus, which forms a vacuum chamber. The ball-grid-array assemblies held in the chamber are protected from receiving any coating on the upper portions of connected solder balls during processing by virtue of intimate contact between the solder balls and the compliant layer of material.

Abstract: A method for providing electrical contact to pads on a surface of a device involves steps of adding a first contact extension to individual ones of the pads, covering the pads and contact extensions with a layer of protective material, removing a portion of the layer of protective material such that a portion of each of the contact extensions is exposed, and applying a second contact extension to individual ones of the exposed first contact extensions. The first extensions may be any of several different kinds, including wires or solder balls, and the protective material layer provides both protection from environmental effects and added lateral strength for the connection of the first extensions to the contact pads.

Abstract: A method for final testing die on a wafer is provided wherein wafers having die are first enhanced by adding contact extensions to contact pads of the die, adding a protective polymer layer covering the contact extensions and planarizing the polymer layer to expose the contact extensions. After this enhancement final testing may be done by probe in the wafer form.

Abstract: A method for providing electrical contact to pads on a surface of a device involves steps of adding a first contact extension to individual ones of the pads, covering the pads and contact extensions with a layer of protective material, removing a portion of the layer of protective material such that a portion of each of the contact extensions is exposed, and applying a second contact extension to individual ones of the exposed first contact extensions. The first extensions may be any of several different kinds, including wires or solder balls, and the protective material layer provides both protection from environmental effects and added lateral strength for the connection of the first extensions to the contact pads.

Abstract: A flux-application fixture for applying flux to die pads in a ball-grid-array assembly process is provided. The fixture comprises a solid plate having a lower surface and an upper surface and a plurality of flux pins formed in the upper surface of the solid plate. The flux pins are contiguous with the solid plate and are formed by removing material from the upper surface of the plate such that the remaining material not removed forms the plurality of flux pins. In a preferred application the material is removed by grinding and the flux plate is ground flat to tight tolerance before removing the material to form the flux pins.

Abstract: A mold system for encapsulating substrate-mounted ICs comprises a split mold having a lower cavity adapted for positioning the substrate and an upper cavity adapted for providing a volume space around the IC. The lower cavity is provided with a compressible shim plate adapted to lie on a bottom surface of the lower cavity such that a substrate of a substrate-mounted IC placed in the lower cavity will extend above the upper limit of the lower cavity, which is the split surface of the mold. As the split mold is closed, a lower surface of the upper mold portion encounters first an upper surface of the substrate, then the compressible shim plate is compressed until the mold is fully closed, at which time the lower surface of the upper mold portion is in intimate contact with both the substrate and the upper surface of the lower mold portion. The IC mounted on the substrate is then presented in the upper cavity for encapsulation.

Abstract: A mold system for encapsulating substrate-mounted ICs includes a split mold having a lower cavity adapted for positioning the substrate and an upper cavity adapted for providing a volume space around the IC. The lower cavity is provided with a compressible shim plate adapted to lie on a bottom surface of the lower cavity such that a substrate of a substrate-mounted IC placed in the lower cavity will extend above the upper limit of the lower cavity, which is the split surface of the mold. As the split mold is closed, a lower surface of the upper mold portion encounters first an upper surface of the substrate, then the compressible shim plate is compressed until the mold is fully closed, at which time the lower surface of the upper mold portion is in intimate contact with both the substrate and the upper surface of the lower mold portion. The IC mounted on the substrate is then presented in the upper cavity for encapsulation.