Patents by Inventor E. H. van Veen

E. H. van Veen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining concentrations by means of atomic emission spectroscopy
    Patent number: 5218553
    Abstract: A method for determining concentrations by means of atomic emission spectroscopy which contains the method steps: (a) generating an atomic emission with a known concentration of a looked-for element, (b) scanning the obtained emission spectrum by means of a spectral photometer with a spectral slit width in a wavelength range which contains a spectral line of the looked-for element, (c) generating an atomic emission with an unknown sample which contains the looked-for element with the concentration of the looked-for element in the unknown sample to be determined, (d) scanning the obtained emission spectrum by means of the spectral photometer with the same spectral slit width and in the same wavelength range in which the scanning of the emission spectrum with the known concentration was made, (e) processing the spectral-representing signal, which is provided by the spectral photometer independent of the wavelength by means of a recursive Kalman filter, in order to generate an estimate for the concentration of t
    Type: Grant
    Filed: August 20, 1990
    Date of Patent: June 8, 1993
    Assignee: The Perkin-Elmer Corporation
    Inventors: M. T. C. de Loos-Vollebregt, E. H. van Veen