Patents by Inventor E. John Vowles
E. John Vowles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6776846Abstract: An integrated wafer processing system having a wafer queuing station and a plurality of plasma reactors connected to peripheral walls of a central vacuum chamber. Vacuum valves separate the central chamber from the queuing station and the plasma reactors. A wafer transfer arm capable of R-&THgr; motion can transfer wafers between the queuing station and any of the plasma reactors in either a single-step or a multi-step process.Type: GrantFiled: April 25, 2002Date of Patent: August 17, 2004Assignee: Applied Materials, Inc.Inventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Publication number: 20020174952Abstract: An integrated wafer processing system having a wafer queuing station and a plurality of plasma reactors connected to peripheral walls of a central vacuum chamber. Vacuum valves separate the central chamber from the queuing station and the plasma reactors. A wafer transfer arm capable of R-&THgr; motion can transfer wafers between the queuing station and any of the plasma reactors in either a single-step or a multi-step process.Type: ApplicationFiled: April 25, 2002Publication date: November 28, 2002Applicant: Applied Materials, Inc.Inventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 6413320Abstract: An integrated wafer processing system having a wafer queuing station and a plurality of plasma reactors connected to peripheral walls of a central vacuum chamber. Vacuum valves separate the central chamber from the queuing station and the plasma reactors. A wafer transfer arm capable of R-&THgr; motion can transfer wafers between the queuing station and any of the plasma reactors in either a single-step or a multi-step process.Type: GrantFiled: February 13, 2001Date of Patent: July 2, 2002Assignee: Applied Materials, Inc.Inventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Publication number: 20010006096Abstract: An integrated wafer processing system having a wafer queuing station and a plurality of plasma reactors connected to peripheral walls of a central vacuum chamber. Vacuum valves separate the central chamber from the queuing station and the plasma reactors. A wafer transfer arm capable of R-&THgr; motion can transfer wafers between the queuing station and any of the plasma reactors in either a single-step or a multi-step process.Type: ApplicationFiled: February 13, 2001Publication date: July 5, 2001Inventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 6214119Abstract: The present invention includes plural plasma processing vessels and a wafer queuing station arrayed with a wafer transfer arm in a controlled environment. Wafers are movable within the controlled environment one at a time selectably between the several plasma vessels and the wafer queuing station without atmospheric or other exposure so that possible contamination of the moved wafers is prevented. The system is selectively operative in either single-step or multiple-step processing modes, and in either of the modes, the several plasma etching vessels are operable to provide a desirably high system throughput. In the preferred embodiment, the several plasma vessels and the queuing station are arrayed about a closed pentagonal locus with the wafer transfer arm disposed within the closed locus.Type: GrantFiled: November 18, 1998Date of Patent: April 10, 2001Assignee: Applied Materials, Inc.Inventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 6103055Abstract: A substrate processing system is provided that includes substrate processing vessels, a substrate queuing station, a substrate transfer device, and a processor. The processor, in communication with the processing vessels, the queuing station, and the transfer device, provides selectable single and multi-step processing of the substrates by accessing a process command for a given substrate corresponding to desired processing of the substrate.Type: GrantFiled: July 14, 1995Date of Patent: August 15, 2000Assignee: Applied Materials, Inc.Inventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 5344542Abstract: The present invention includes plural plasma etching vessels and a wafer queuing station arrayed with a wafer transfer arm in a controlled environment. Wafers are movable within the controlled environment one at a time selectably between the several plasma vessels and the wafer queuing station without atmospheric or other exposure so that possible contamination of the moved wafers is prevented. The system is selectively operative in either single-step or multiple-step processing modes, and in either of the modes, the several plasma etching vessels are operable to provide a desirably high system throughput. In the preferred embodiment, the several plasma vessels and the queuing station are arrayed about a closed pentagonal locus with the wafer transfer arm disposed within the closed locus.Type: GrantFiled: December 16, 1991Date of Patent: September 6, 1994Assignee: General Signal CorporationInventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 5308431Abstract: The present invention includes plural plasma etching vessels and a wafer queuing station arrayed with a wafer transfer arm in a controlled environment. Wafers are movable within the controlled environment one at a time selectably between the plasma vessels and the wafer queuing station without atmospheric or other possible contamination. The system is selectively operative in either single-step or multiple-step processing modes. In the preferred embodiment, the plasma vessels and the queuing station are arrayed about a closed pentagonal locus with the wafer transfer arm disposed within the closed locus. The wafer transfer arm is movable between the plasma etching vessels and the wafer queuing station. Selectably actuable vacuum locks are provided between the plasma etching vessels and the wafer transfer arm to maintain an intended atmospheric condition and to allow wafer transport therethrough. The plasma vessels each include first and second water-cooled electrodes that are movable relatively to each other.Type: GrantFiled: April 3, 1992Date of Patent: May 3, 1994Assignee: General Signal CorporationInventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 5102495Abstract: Plural plasma etching vessels and a wafer queuing station are arrayed about a closed pentagonal locus with a wafer transfer arm therewithin all in a controlled vacuum environment. Wafers are movable within the controlled environment between the several plasma vessels and the wafer queuing station without atmospheric or other exposure so that possible contamination of the moved wafers is prevented. The system is selectively operative in either single-step or multiple-step processing modes, and in either of the modes, the several plasma etching vessels are operable to provide a desirably high system throughput. Wafer processing in each vessel is regulated by a state controller for processing a plurality of wafers from a single cassette, contained within the vacuum environment of the plural plasma etching vessels and wafer queuing station, to provide an orderly and efficient throughput of wafers for diverse or similar processing in the plural vessels. The wafer transfer arm is movable in R and .theta..Type: GrantFiled: April 22, 1991Date of Patent: April 7, 1992Assignee: General Signal CorporationInventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 5076205Abstract: A system for multichamber processing of semiconductor wafers providing flexibility in the nature of processing available in a multi processing facility. To accommodate changing processing demands and chamber replacement, a mobile processing chamber selectively docks with a multiple chamber system to form one of its processing chambers. The capabilities of the multiprocessing multichamber system are enhanced by extending the system to other multichamber systems through intermediate buffer storage wafer cassette and elevator systems. The extending multichamber system is further provided with intermediate access wafer storage elevator cassettes.Type: GrantFiled: January 6, 1989Date of Patent: December 31, 1991Assignee: General Signal CorporationInventors: E. John Vowles, Joseph A. Maher, Joseph D. Napoli
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Patent number: 5013385Abstract: The present invention includes plural plasma etching vessels and a wafer queuing station arrayed with a wafer transfer arm in a controlled environment. Wafers are movable within the controlled environment one at a time selectably between the several plasma vessels and the wafer queuing station without atmospheric or other exposure to that possible contamination of the moved wafers is prevented. The system is selectively operative in either single-step or multiple-step processing modes, and in either of the modes, the several plasma etching vessels are operable to provide a desirably high system throughput. In the preferred embodiment, the several plasma vessels and the queuing station are arrayed about a closed pentagonal locus with the wafer transfer arm disposed within the closed locus.Type: GrantFiled: December 1, 1989Date of Patent: May 7, 1991Assignee: General Signal CorporationInventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller
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Patent number: 5013400Abstract: A two-step process for forming champagne profiles on semiconductor wafers that provide, when metallized, good reliability, microcracking-free contacts and vias is disclosed. Dry etch apparatus having electrodes in a triode configuration, two plasma forming regions, and a pressure control system operative to provide a wide setpoint pressure range is also disclosed.Type: GrantFiled: January 30, 1990Date of Patent: May 7, 1991Assignee: General Signal CorporationInventors: Howard S. Kurasaki, Barbara F. Westlund, James E. Nulty, E. John Vowles
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Patent number: 4715921Abstract: The present invention includes plural plasma etching vessels and a wafer queuing station arrayed with a wafer transfer arm in a controlled environment. Wafer processing in each vessel is regulated by a state controller for processing a plurality of wafers from a single cassette, contained within the vacuum environment of the plural plasma etching vessels and wafer queuing station, to provide an orderly and efficient throughput of wafers for diverse or similar processing in the plural vessels. In this manner a wafer can be processed as soon as a vessel becomes available.Type: GrantFiled: October 24, 1986Date of Patent: December 29, 1987Assignee: General Signal CorporationInventors: Joseph A. Maher, E. John Vowles, Joseph D. Napoli, Arthur W. Zafiropoulo, Mark W. Miller