Patents by Inventor E. Keith Howick, Jr.

E. Keith Howick, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for optimized constraint characterization with degradation options and associated methods
    Patent number: 6584598
    Abstract: A circuit-characterization system includes a computer. The computer uses a model of an operation of the circuit to characterize first and second constraints of the circuit and to select values for the first and second constraints, respectively. The computer modifies the values selected for the first and second constraints to obtain optimized values for the first and second constraints. The optimized values of the first and second constraints avoid an invalid region of operation of the circuit.
    Type: Grant
    Filed: July 13, 2001
    Date of Patent: June 24, 2003
    Assignee: Silicon Metrics Corporation
    Inventors: Guruprasad G. Rao, E. Keith Howick, Jr.