Patents by Inventor E. Michael Brauss

E. Michael Brauss has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray diffraction apparatus and method
    Patent number: 9613728
    Abstract: An x-ray diffraction apparatus is provided having an x-ray diffraction head, a frame for supporting the x-ray diffraction head, and a pair of drive mechanisms of the frame configured to generate pivotal movement of the x-ray diffraction head about first and second orthogonal axes. The frame is configured such that operation of one of the drive mechanisms to rotate the x-ray diffraction head about the first axis generates rotation of both of the drive mechanisms about the first axis.
    Type: Grant
    Filed: March 14, 2014
    Date of Patent: April 4, 2017
    Assignee: Proto Manufacturing Ltd.
    Inventor: E. Michael Brauss
  • X-Ray Diffraction Apparatus And Method
    Publication number: 20140270090
    Abstract: An x-ray diffraction apparatus is provided having an x-ray diffraction head, a frame for supporting the x-ray diffraction head, and a pair of drive mechanisms of the frame configured to generate pivotal movement of the x-ray diffraction head about first and second orthogonal axes. The frame is configured such that operation of one of the drive mechanisms to rotate the x-ray diffraction head about the first axis generates rotation of both of the drive mechanisms about the first axis.
    Type: Application
    Filed: March 14, 2014
    Publication date: September 18, 2014
    Applicant: Proto Manufacturing Ltd.
    Inventor: E. Michael Brauss
  • Non-destructive testing systems and methods
    Patent number: 8477905
    Abstract: A system and method for non-destructively determining the grain orientation of a crystalline material using x-ray diffraction techniques to non-destructively analyze material and, more particularly, to a system and method for determining the grain orientation of an underlying crystalline material covered by an overlying polycrystalline material. Further, the system and method relate to the use of x-ray diffraction to non-destructively characterize parts and components to determine whether to accept or reject those components or parts for use in application.
    Type: Grant
    Filed: March 19, 2010
    Date of Patent: July 2, 2013
    Assignee: Proto Manufacturing Ltd.
    Inventors: Mohammed Belassel, E. Michael Brauss, James A. Pineault, Robert John Drake
  • NON-DESTRUCTIVE TESTING SYSTEMS AND METHODS
    Publication number: 20100239068
    Abstract: A system and method for non-destructively determining the grain orientation of a crystalline material using x-ray diffraction techniques to non-destructively analyze material and, more particularly, to a system and method for determining the grain orientation of an underlying crystalline material covered by an overlying polycrystalline material. Further, the system and method relate to the use of x-ray diffraction to non-destructively characterize parts and components to determine whether to accept or reject those components or parts for use in application.
    Type: Application
    Filed: March 19, 2010
    Publication date: September 23, 2010
    Inventors: Mohammed Belassel, E. Michael Brauss, James A. Pineault, Robert John Drake