Patents by Inventor E. Michael Burka

E. Michael Burka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6141100
    Abstract: Method and apparatus for providing an imaging attenuated total reflection (ATR) spectrometer which provides faster measurement speed and better spatial resolution than systems collecting an equivalent amount of data using conventional, non-imaging ATR methods and systems. Apparatus includes a radiation source, an interferometer coupled to the radiation source which produces a spectrally-multiplexed input beam of radiation, an internal reflection element (IRE) engaging a sample-under-test, a focal plane array detector, a first optical system adapted and positioned to direct and concentrate the input beam through the rear surface of the IRE towards a contact area of the sample such that an angle of incidence of said input beam at the front surface is equal to or greater than the critical angle for the IRE, and a second optical system adapted and positioned to collect reflected radiation from the contact area and image the same onto the focal plane array detector.
    Type: Grant
    Filed: July 15, 1998
    Date of Patent: October 31, 2000
    Assignee: Bio-Rad Laboratories, Inc.
    Inventors: E. Michael Burka, Raul Curbelo