Patents by Inventor E. Stuart Nelan

E. Stuart Nelan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090052279
    Abstract: A method and system determines optimum azimuth parameters for seismic data processing. The method includes selecting a range of azimuth parameters, the azimuth parameters indicating the range of magnitudes and directions, each pair of azimuth parameters indicating a particular magnitude and a particular direction. The method further includes generating a plurality of seismic gathers wherein a seismic gather is generated from each pair of azimuth parameters, each seismic gather including a plurality of seismic data traces. The method further includes generating a plurality of seismic gathers for a plurality of imaging locations and a plurality of depths, each seismic gather containing a plurality of seismic data traces. The method further includes determining the coherence amplitude of each gather. The method further includes determining the gather having the optimum coherence amplitude, and selecting the azimuth parameters associated with the gather having the optimum coherence amplitude.
    Type: Application
    Filed: August 21, 2007
    Publication date: February 26, 2009
    Inventors: Charles Sicking, E. Stuart Nelan, William H. McLain
  • Patent number: 6026057
    Abstract: A method and computer system for correcting seismic signals in a seismic survey, sensed in horizontal and vertical directions at receiver locations, is disclosed. According to the disclosed method and system, the horizontal and vertical seismic signal traces are processed in prestack gathers, after normal move-out correction. For each reflection event indicated in the prestack gathers, a performance function is evaluated over a range of zero-offset directivity and directivity slope values, using the horizontal and vertical pressure wave components sensed at the receivers. The zero-offset directivity and directivity slope values that return the maximum performance function are stored in connection with the gather and the reflection event, as indicative of the zero-offset dip and offset-dependent directivity of the reflective surface corresponding to the reflected event.
    Type: Grant
    Filed: June 4, 1998
    Date of Patent: February 15, 2000
    Assignee: Atlantic Richfield Company
    Inventors: Bok S. Byun, E. Stuart Nelan, Chi Young
  • Patent number: 5933789
    Abstract: A method and computer system for deriving and applying normal moveout phase and time shift corrections to seismic survey traces is disclosed. Normal moveout time-shift corrections are first applied to traces in a common midpoint (CMP) or common depth point (CDP) gather, based upon stacking velocity analysis applied to envelopes of the traces. One offset in the survey, preferably the maximum offset, is selected as the reference point; the NMO time shift at this reference offset is then selected as a reference NMO time-shift. The traces in the gather are each phase-shifted based upon iterated reference phase dispersion values at the reference offset, times the ratio of the normal moveout time-shifts for the trace in the gather to that of the reference offset (raised to a power). Semblance analysis is performed to identify, for each point in normal incidence time and thus for each reflective event, the optimum reference phase dispersion value.
    Type: Grant
    Filed: November 12, 1996
    Date of Patent: August 3, 1999
    Assignee: Atlantic Richfield Company
    Inventors: Bok S. Byun, David D. Thompson, E. Stuart Nelan
  • Patent number: 5684754
    Abstract: A computer-implemented method and system of correcting seismic survey data for the effects of NMO stretch is disclosed. The method operates upon a CDP gather of seismic survey data after normal move-out correction (NMO) has been applied. A semblance analysis is used to derive a stretch coefficient .kappa. profile over the gather, as a function of time and offset. The values of the stretch coefficient profile .kappa. are used in producing a time-varying filter that is applied, preferably by way of a time-domain multiplication, to incremental windows in time for each trace, with the products added to one another to generate a corrected trace. After all of the traces in the gather are corrected, an event-weighted filter is applied to the traces by way of a correlation operation, to remove high-frequency artifacts in the corrected traces. The corrected and filtered traces are then ready for stacking and conventional processing.
    Type: Grant
    Filed: December 13, 1995
    Date of Patent: November 4, 1997
    Assignee: Atlantic Richfield Company
    Inventors: Bok S. Byun, E. Stuart Nelan