Patents by Inventor Eai-Hsin Alfred Kuo

Eai-Hsin Alfred Kuo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and context switch device for implementing design-for-testability functionality of latch-based register files
    Patent number: 7979684
    Abstract: A method of changing execution contexts is provided that includes receiving a context selection input. In a first clock phase, the method includes shifting data from a first latch element of a normal execution context to a second latch element of the normal execution context and shifting shadow data from a third latch element of a shadow execution context to a fourth latch element of the shadow execution context. In a second clock phase, the method includes shifting the shadow data of the fourth latch element of the shadow execution context into the first latch element of the normal execution context and shifting the data of the second latch element of the normal execution context into the third latch element of the shadow execution context. In a particular embodiment, the method may include receiving a test mode selection and shifting test data, such as scan test or automatic test pattern generated data, to a test output.
    Type: Grant
    Filed: August 7, 2006
    Date of Patent: July 12, 2011
    Assignee: QUALCOMM Incorporated
    Inventors: Jentsung Lin, Eai-Hsin Alfred Kuo, De Dzwo Hsu
  • Register with a context switch device and method of context switching
    Publication number: 20080034192
    Abstract: A method of changing execution contexts is provided that includes receiving a context selection input. In a first clock phase, the method includes shifting data from a first latch element of a normal execution context to a second latch element of the normal execution context and shifting shadow data from a third latch element of a shadow execution context to a fourth latch element of the shadow execution context. In a second clock phase, the method includes shifting the shadow data of the fourth latch element of the shadow execution context into the first latch element of the normal execution context and shifting the data of the second latch element of the normal execution context into the third latch element of the shadow execution context. In a particular embodiment, the method may include receiving a test mode selection and shifting test data, such as scan test or automatic test pattern generated data, to a test output.
    Type: Application
    Filed: August 7, 2006
    Publication date: February 7, 2008
    Inventors: Jentsung Lin, Eai-Hsin Alfred Kuo, De Dzwo Hsu