Patents by Inventor Ean-Sue Lee

Ean-Sue Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MICRO CONTROL UNIT FOR PROVIDING STABLE VOLTAGE OUTPUT TO ELECTRIC DEVICE AND SYSTEM FOR PROTECTING ELECTRIC DEVICE
    Publication number: 20120277931
    Abstract: The present invention is to disclose a micro control unit for an electric device. It includes a charge pump regulator, connected to an external DC power source, for boosting and regulating voltage outputted from the DC power source; and a controller, switched between the external DC power source while a current of the DC power source is stable and the charge pump regulator while the current is unstable, for outputting a stable voltage to the electric device, thereby eliminating damage to the electric device caused by input surge current.
    Type: Application
    Filed: April 28, 2011
    Publication date: November 1, 2012
    Applicant: HYCON TECHNOLOGY CORP.
    Inventors: Po-Yin Chao, Ean-Sue Lee, Shui-Chu Lee, Shu-Lan Xie
  • Temperature measuring system and measuring method using the same
    Patent number: 7841770
    Abstract: A temperature measuring system and a measuring method using the same are disclosed. The method for measuring an integrated circuit temperature includes the steps of: detecting a first difference in output voltage values between a first transistor and a second transistor by providing a first current through the first transistor and a second current through the second transistor; detecting a second difference in output voltage values between the first transistor and the second transistor by providing the second current through the first transistor and the first current through the second transistor; obtaining an average value by averaging the first difference and the second difference; and determining the temperature by multiplying the average value with a predetermined value.
    Type: Grant
    Filed: May 29, 2008
    Date of Patent: November 30, 2010
    Assignee: Hycon Technology Corp.
    Inventors: Ean-Sue Lee, Po-Yin Chao
  • Temperature measuring system and measuring method using the same
    Publication number: 20090296780
    Abstract: A temperature measuring system and a measuring method using the same are disclosed. The method for measuring an integrated circuit temperature includes the steps of: detecting a first difference in output voltage values between a first transistor and a second transistor by providing a first current through the first transistor and a second current through the second transistor; detecting a second difference in output voltage values between the first transistor and the second transistor by providing the second current through the first transistor and the first current through the second transistor; obtaining an average value by averaging the first difference and the second difference; and determining the temperature by multiplying the average value with a predetermined value.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: HYCON TECHNOLOGY CORP.
    Inventors: Ean-Sue Lee, Po-Yin Chao