Abstract: A contactor apparatus used in automatic testing of integrated circuits is provided. The invented apparatus, or assembly, enables the rapid automated test transition from testing a plurality of devices of a first body shape to a plurality of devices having a second body shape, where both types of devices have electrical contacts arranged within a device contact plane and according to a common grid pattern. The common grid pattern may be arranged along an X and an orthogonal Y axis, where contact points are spaced at identical intervals along each axis, e.g. a contact point at each 0.8 millimeter by 0.8 millimeter location, or where the contact points are spaced at differing intervals in each dimension, e.g. a plurality of contact points located at 0.8 millimeter lengths along the X axis and at 1.2 millimeter lengths along the Y axis. The contactor may have a plurality of apertures useful to simultaneously test a plurality of devices.

Abstract: A test manipulator comprises a floor stand with a vertical column to support the weight of a test head. The vertical column includes a shaft along which a cradle assembly for the test head can be slid up and down, pivoted, and twisted. A tool balancer is connected to the cradle assembly and provides for weightlessness by counterbalancing. A fall arrester is independently connected to the cradle assembly to allow slow unimpeded movements of the cradle assembly up-and-down, and to automatically lock-up to prevent a sudden fall of the cradle assembly. Releasing the load prevented from falling will reset the fall arrestor.

Abstract: A contactor apparatus used in automatic testing of integrated circuits is provided. The invented apparatus, or assembly, enables the rapid automated test transition from testing a plurality of devices of a first body shape to a plurality of devices having a second body shape, where both types of devices have electrical contacts arranged within a device contact plane and according to a common grid pattern. The common grid pattern may be arranged along an X and an orthogonal Y axis, where contact points are spaced at identical intervals along each axis, e.g. a contact point at each 0.8 millimeter by 0.8 millimeter location, or where the contact points are spaced at differing intervals in each dimension, e.g. a plurality of contact points located at 0.8 millimeter lengths along the X axis and at 1.2 millimeter lengths along the Y axis. The contactor may have a plurality of apertures useful to simultaneously test a plurality of devices.