Patents by Inventor Ebrahim Khalily

Ebrahim Khalily has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Physics-based MOSFET model for variational modeling
    Patent number: 8271256
    Abstract: A method of optimizing MOSFET device production which includes defining key independent parameters, formulating those key independent parameters into a canonical variational form, calculating theoretical extracted parameters using at least one of key independent parameters in canonical variational form, physics-based analytical models, or corner models. The method also includes calculating simulated characteristics of a device using the key independent parameters and extracting target data parameters based on at least one of measured data and predicted data, comparing the simulated characteristics to the target data parameters, and modifying the theoretical extracted parameters or key independent parameters in canonical form as a result of the comparison. Then, calculating and outputting the simulated characteristics based on the modified theoretical extracted parameters and the modified key independent parameters in canonical form.
    Type: Grant
    Filed: August 13, 2009
    Date of Patent: September 18, 2012
    Assignee: Oracle America, Inc.
    Inventors: Ebrahim Khalily, Aaron J. Barker, Alexandru N. Ardelea
  • PHYSICS-BASED MOSFET MODEL FOR VARIATIONAL MODELING
    Publication number: 20110040548
    Abstract: A method of optimizing MOSFET device production which includes defining key independent parameters, formulating those key independent parameters into a canonical variational form, calculating theoretical extracted parameters using at least one of key independent parameters in canonical variational form, physics-based analytical models, or corner models. The method also includes calculating simulated characteristics of a device using the key independent parameters and extracting target data parameters based on at least one of measured data and predicted data, comparing the simulated characteristics to the target data parameters, and modifying the theoretical extracted parameters or key independent parameters in canonical form as a result of the comparison. Then, calculating and outputting the simulated characteristics based on the modified theoretical extracted parameters and the modified key independent parameters in canonical form.
    Type: Application
    Filed: August 13, 2009
    Publication date: February 17, 2011
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: Ebrahim Khalily, Aaron J. Barker, Alexandru N. Ardelea