Patents by Inventor Eckart Hundt

Eckart Hundt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5499303
    Abstract: A method for correcting the gaze direction of persons in a digital image where an angular error between the gaze direction and the camera axis is determined. The pupils of both eyes in the image are then segmented and displaced within the image plane. Areas which have become free are filled in using the color of the eyeball. Any interfering edges produced are attenuated in a subsequent processing step (e.g., by using a low-pass filter). The method is also applicable for a sequence of images over time.
    Type: Grant
    Filed: July 27, 1993
    Date of Patent: March 12, 1996
    Assignee: Siemens Aktiengesellschaft
    Inventors: Eckart Hundt, Thomas Riegel, Heinz Schwartzel, Manfred Ziegler
  • Patent number: 4589284
    Abstract: An ultrasonic head is a linear array consisting of a plurality of transducer elements. The array is perpendicular to a sectional plane of the object under study and can be rotated about its longitudinal axis. Several groups each consisting of jointly controlled transducer elements are driven to form a beam aperture. Between each two adjacent driven groups there is provided at least one group that is switched off. The ultrasonic tomography unit thus obtained scans several parallel section levels one after the other or even, at least approximately simultaneously, without additional mechanical movement.
    Type: Grant
    Filed: December 17, 1984
    Date of Patent: May 20, 1986
    Assignee: Siemens Aktiengesellschaft
    Inventors: Fritz Breimesser, Dietrich Hassler, Eckart Hundt, Gerd Maderlechner, Elmar Trautenberg
  • Patent number: 4418575
    Abstract: In an exemplary embodiment partial images of an object are obtained by scanning the object from different directions, e.g. by compound scanning. For a given object region or point, the different partial images may include a response maximum signifying a directionally reflecting region. Other object regions may provide echo signal amplitudes in a range signifying a locally isotropic scattering. According to the disclosure, the partial images are linked or combined taking account of the nature of the respective object regions as being directionally reflecting or nondirectionally scattering.
    Type: Grant
    Filed: May 15, 1981
    Date of Patent: December 6, 1983
    Assignee: Siemens Aktiengesellschaft
    Inventors: Eckart Hundt, Elmar Trautenberg
  • Patent number: 4407163
    Abstract: In an exemplary embodiment, the processing techniques of computerized x-ray tomography are applied to improve resolution transverse to the depth direction, for example with the use of compound ultrasonic scanning. In this way, an improved preliminary image for representing non-directionally scattering image points is attained. The ultrasonic echo signals are also processed to provide a preliminary image based predominantly or exclusively on directionally reflecting image points. The respective preliminary images for each image point or point region are then suitably combined to provide a stored ultrasonic image capable of display of the scanned region of improved accuracy, resolution, and freedom from noise.
    Type: Grant
    Filed: May 15, 1981
    Date of Patent: October 4, 1983
    Assignee: Siemens Aktiengesellschaft
    Inventors: Eckart Hundt, Elmar Trautenberg
  • Patent number: 4187431
    Abstract: In an illustrative embodiment marks with dual x-ray permeable apertures are at three spaced locations on the mask and transmit x-ray beams which are directed obliquely to the semiconductor surface. In this case, the marks on the semiconductor disc may be formed by monocrystals shaped in conformity with the incident beam cross section and located so as to produce reflected x-ray beams which intersect correspondingly shaped further apertures of the respective dual aperture marks on the mask. Alternatively the beams may impinge on the surface of the semiconductor disc itself at an angle to produce reflection, with x-ray absorbing material surrounding each reflecting region. In either case the reflected beams as transmitted by the further apertures are detected as a measure of the degree of parallelism of the mask and semiconductor disc.
    Type: Grant
    Filed: May 10, 1978
    Date of Patent: February 5, 1980
    Assignee: Siemens Aktiengesellschaft
    Inventor: Eckart Hundt
  • Patent number: 4176281
    Abstract: In the illustrative disclosure, alignment of x-ray masks, with elements in the submicron range for x-ray lithographic replication, is carried out with the use of through-bores in the set of masks and in the substrates. A single point x-ray source may be used to produce widely offset parallel beams defining the bore alignment axes, or the bores may be formed with oblique axes converging at a point, so as to be usable with diverging x-ray beams from a point x-ray source.
    Type: Grant
    Filed: April 20, 1978
    Date of Patent: November 27, 1979
    Assignee: Siemens Aktiengesellschaft
    Inventors: Peter Tischer, Eckart Hundt