Patents by Inventor Ed Huth

Ed Huth has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Run-Time Characterization of On-Demand Analytical Model Accuracy
    Publication number: 20080126029
    Abstract: A method of determining accuracy of predicted system behavior can include creating a plurality of noise adjusted analytical models, wherein each noise adjusted analytical model is associated with a set of predefined analytical model parameters. A set of inferred analytical model parameters for each noise adjusted analytical model can be derived. Each set of inferred analytical model parameters can depend upon a current noise adjusted analytical model and each prior noise adjusted analytical model. For each set of inferred analytical model parameters, a measure of error between the set of inferred analytical model parameters and the set of predefined analytical model parameters associated with the noise adjusted analytical model from which the set of inferred analytical model parameters was derived can be determined.
    Type: Application
    Filed: November 24, 2006
    Publication date: May 29, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Curtis E. Hrischuk, Ed Huth, Dazhi Wang, Li Zhang