Patents by Inventor Ed Jenkins

Ed Jenkins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for automated testing of the modulation transfer function in image sensors
    Patent number: 7646016
    Abstract: A method for automatically measuring the modulation transfer function of an imager is disclosed. A opaque mask is placed over selected columns and rows of the imager during fabrication. In the course of an automated process, photons are uniformly shone over the image sensor. The amount of the input signal that flows from the unmasked pixel cells to the masked pixel cells can then be measured and the modulation transfer function can be determined.
    Type: Grant
    Filed: June 22, 2006
    Date of Patent: January 12, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Kevin Duesman, Jeffrey Bruce, Peter P. Altice, Jr., Moshe Reuven, Donald E. Robinson, Ed Jenkins, Joey Shah
  • Method for automated testing of the modulation transfer function in image sensors
    Patent number: 7215361
    Abstract: A method for automatically measuring the modulation transfer function of an imager is disclosed. A opaque mask is placed over selected columns and rows of the imager during fabrication. In the course of an automated process, photons are uniformly shone over the image sensor. The amount of the input signal that flows from the unmasked pixel cells to the masked pixel cells can then be measured and the modulation transfer function can be determined.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: May 8, 2007
    Assignee: Micron Technology, Inc.
    Inventors: Kevin Duesman, Jeffrey Bruce, Peter P. Altice, Jr., Moshe Reuven, Donald E. Robinson, Ed Jenkins, Joey Shah
  • Method for automated testing of the modulation transfer function in image sensors
    Publication number: 20060237755
    Abstract: A method for automatically measuring the modulation transfer function of an imager is disclosed. A opaque mask is placed over selected columns and rows of the imager during fabrication. In the course of an automated process, photons are uniformly shone over the image sensor. The amount of the input signal that flows from the unmasked pixel cells to the masked pixel cells can then be measured and the modulation transfer function can be determined.
    Type: Application
    Filed: June 22, 2006
    Publication date: October 26, 2006
    Inventors: Kevin Duesman, Jeffrey Bruce, Peter Altice, Moshe Reuven, Donald Robinson, Ed Jenkins, Joey Shah
  • Method for automated testing of the modulation transfer function in image sensors
    Publication number: 20050057655
    Abstract: A method for automatically measuring the modulation transfer function of an imager is disclosed. A opaque mask is placed over selected columns and rows of the imager during fabrication. In the course of an automated process, photons are uniformly shone over the image sensor. The amount of the input signal that flows from the unmasked pixel cells to the masked pixel cells can then be measured and the modulation transfer function can be determined.
    Type: Application
    Filed: September 17, 2003
    Publication date: March 17, 2005
    Inventors: Kevin Duesman, Jeffrey Bruce, Peter Altice, Moshe Reuven, Donald Robinson, Ed Jenkins, Joey Shah