Patents by Inventor Ed Killian

Ed Killian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thickness measuring system for nonconducting materials
    Patent number: 5138268
    Abstract: A device and method for detecting the thickness of an essentially nonconducting material during movement of the material within the dielectric between the plates of a capacitance detection probe is disclosed. The detection probe is electrically coupled to a material thickness analysis system containing an oscillator with an output frequency that is a related to the dielectric between the plates. Storage and analysis of output frequencies for the oscillator with and without the nonconducting material between the plates generates material thickness information.
    Type: Grant
    Filed: August 15, 1990
    Date of Patent: August 11, 1992
    Inventors: Steve Mulkey, Pat Corriea, Ed Killian, Gordon Lowry