Abstract: In accordance with an example, a process control system includes a fluidic line having a longitudinal axis and including a fluidic connection. The fluidic connection has an axis angled relative to the longitudinal axis of the fluidic line. The process control system includes a primary block valve having an inlet port and an outlet port. The inlet port is coupled to the fluidic connection. The process control system includes a monoflange including a male portion forming an inlet port and including an external threaded surface. The monoflange includes an outlet and a flanged interface surrounding the outlet port of the monoflange. The monoflange includes a bleed port. The monoflange includes a bleed valve adapted to control fluid flow from the bleed port and a secondary block valve adapted to control fluid flow from the outlet port. The external threaded surface of the male portion threadably engages the outlet port of primary block valve.

Abstract: In accordance with an example, a process control system includes a fluidic line having a longitudinal axis and including a fluidic connection. The fluidic connection has an axis angled relative to the longitudinal axis of the fluidic line. The process control system includes a primary block valve having an inlet port and an outlet port. The inlet port is coupled to the fluidic connection. The process control system includes a monoflange including a male portion forming an inlet port and including an external threaded surface. The monoflange includes an outlet and a flanged interface surrounding the outlet port of the monoflange. The monoflange includes a bleed port. The monoflange includes a bleed valve adapted to control fluid flow from the bleed port and a secondary block valve adapted to control fluid flow from the outlet port. The external threaded surface of the male portion threadably engages the outlet port of primary block valve.

Abstract: An apparatus and method for measuring the space between a transparent member such as a substrate, and reflective member such as a slider. The apparatus includes a first optical system which detects a first light beam that is reflected from the substrate and the slider. The reflected light is separated into four separate beams. The intensities of the beams are detected and utilized to determine a first stokes parameter, a second stokes parameter, a third stokes parameter and a fourth stokes parameter of the reflected light. The stokes parameters are used to compute the real index of refraction n, extinction coefficient k and the thickness of the space. The four stokes parameters account for any depolarized light that is reflected from the slider. The first optical system may have a photodetector which detects an image of the slider. The image provides multiple data points that can be used to calculate n, k and the thickness of the air gap without a retract routine.

Abstract: A method and apparatus for measuring structural characteristics of a manufactured circuit board containing solder joints by automated real-time digital X-ray radiographic inspection techniques. A circuit board under examination is automatically positioned by a digitally controlled multi-axis positioning system between an electronic X-ray source and an electronic X-ray imaging system. X-rays, in a beam of X-rays from the X-ray source, are directed towards the circuit board. The X-rays are absorbed, scattered and transmitted through the circuit board. The X-rays transmitted through the circuit board are directed upon the X-ray imaging system. The X-ray imaging system converts the transmitted X-rays into digital images which represent the radiographic density of the portion of the circuit board under examination. The digital images are stored within a digital image processor.

Abstract: A method and apparatus for measuring structural characteristics of a manufactured circuit board containing solder joints by automated real-time digital X-ray radiographic inspection techniques. A circuit board under examination is automatically positioned by a digitally controlled multi-axis positioning system between an electronic X-ray source and an electronic X-ray imaging system, X-rays, in a beam of X-rays from the X-ray source, are directed towards the circuit board. The X-rays are absorbed, scattered and transmitted through the circuit board. The X-rays transmitted through the circuit board are directed upon the X-ray imaging system. The X-ray imaging system converts the transmitted X-rays into digital images which represent the radiographic density of the portion of the circuit board under examination. The digital images are stored within a digital image processor.