Patents by Inventor Eddie R. Riddle

Eddie R. Riddle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4525854
    Abstract: A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined.
    Type: Grant
    Filed: March 22, 1983
    Date of Patent: June 25, 1985
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventors: John L. Molbert, Eddie R. Riddle