Abstract: Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

Abstract: Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

Abstract: Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.

Abstract: Described herein are, among others, systems and methods associated with electrical test planning in a semiconductor manufacturing context. Within an electrical test planning system in the semiconductor industry, various models that allow a better utilization of installed capacity were developed. The workflow in the plant and the information flow in the electrical test planning area were analyzed to reduce or minimize setup times on the equipment. A paradigm shift is disclosed, with which planning is done at the product family level instead of at the level of the part number, starting with priority products required by the market.