Abstract: This band-gap circuit overcomes the deficiencies of conventional band-gap circuits by compensating for higher order temperature effects, thereby increasing accuracy. A first resistor network including two resistors is connect to a first transistor while a second resistor network that includes one resistor is connected to a second transistor. One resistor in the first resistor network has a high temperature sensitivity, and therefore produces a temperature dependent ratio of currents through the transistors. The inverting input and noninverting input of an operational amplifier are coupled to the collectors of the two transistors. The emitter region of the second transistor is coupled to two additional resistors which are connected in series to each other. The emitter region of the first transistor is coupled to the junction between these two additional resistors. The output of the operational amplifier is coupled to the bases of the transistors.

Abstract: Low noise bandgap references of the type providing a temperature independent output by balancing the proportional to absolute temperature dependence of the difference in base-emitter voltages of two transistors operating at different current densities with the negative temperature coefficient of the base-emitter voltage of a transistor. The bandgap references disclosed reduce the noise characteristic of such references by balancing the difference in base-emitter voltages of a first number of pairs of transistors, each pair having two transistors operating at different current densities, with the negative temperature coefficient of the base-emitter voltage of a second number of transistors, the second number being less than the first number. Various embodiments are disclosed, including embodiments having an output corresponding to the bandgap of the transistor material, and multiples of the bandgap of the transistor material.

Abstract: Disclosed is band-gap circuit that overcomes the deficiencies of conventional band-gap circuits by compensating for high order temperature effects. The invention employs a resistor of high temperature sensitivity in parallel with a resistor having a low temperature sensitivity in the collector circuit of the transistors to counter inherent higher order temperature effects found in prior art circuits. Furthermore, the invention has a reduced sensitivity to the variables within manufacturing of integrated semiconductor devices.

Abstract: This band-gap circuit overcomes the deficiencies of conventional band-gap circuits by compensating for higher order temperature effects, thereby increasing accuracy. A first resistor network including two resistors is connect to a first transistor while a second resistor network that includes one resistor is connected to a second transistor. One resistor in the first resistor network has a high temperature sensitivity, and therefore produces a temperature dependent ratio of currents through the transistors. The inverting input and noninverting input of an operational amplifier are coupled to the collectors of the two transistors. The emitter region of the second transistor is coupled to two additional resistors which are connected in series to each other. The emitter region of the first transistor is coupled to the junction between these two additional resistors. The output of the operational amplifier is coupled to the bases of the transistors.

Abstract: Proportional to absolute temperature references having reduced input sensitivity. The references utilize four bipolar transistors, at least one of which is of a different size, coupled to a resistor in a loop, whereby the difference in the VBEs of the transistors appears as a voltage across the resistor. The addition of a further resistor of a selected size in the base circuit of one of the four transistors provides an input variation of an opposite sign to that caused by the finite base currents of the transistors, thereby substantially reducing the input voltage (current) dependence of the proportional to absolute temperature references. Various embodiments are disclosed.

Abstract: This band-gap circuit overcomes the deficiencies of conventional band-gap circuits by compensating for higher order temperature effects, thereby increasing accuracy. A first resistor network including two resistors is connect to a first transistor while a second resistor network that includes one resistor is connected to a second transistor. One resistor in the first resistor network has a high temperature sensitivity, and therefore produces a temperature dependent ratio of currents through the transistors. The inverting input and noninverting input of an operational amplifier are coupled to the collectors of the two transistors. The emitter region of the second transistor is coupled to two additional resistors which are connected in series to each other. The emitter region of the first transistor is coupled to the junction between these two additional resistors. The output of the operational amplifier is coupled to the bases of the transistors.

Abstract: Proportional to absolute temperature references having reduced input sensitivity. The references utilize four bipolar transistors, at least one of which is of a different size, coupled to a resistor in a loop, whereby the difference in the VBEs of the transistors appears as a voltage across the resistor. The addition of a further resistor of a selected size in the base circuit of one of the four transistors provides an input variation of an opposite sign to that caused by the finite base currents of the transistors, thereby substantially reducing the input voltage (current) dependence of the proportional to absolute temperature references. Various embodiments are disclosed.

Abstract: In a multi-stage, multi-residue interpolating analog-to-digital converter (ADC), which is suitable for pipelined implementation, inputs of at least three amplifiers are "leapfrog" switched to adjacent nodes of a first interpolation ladder having discrete voltage levels established thereon. Pairs of the amplifiers drive second interpolation ladders to establish additional discrete voltage levels (in a nominal and an overlap conversion region) at nodes of the second interpolation ladders. A bank of comparators compares a predetermined threshold voltage, e.g., ground, to several of the discrete voltage levels at the nodes of the first interpolation ladder. The switches controlling which inputs of the amplifiers are connected to which nodes of the first interpolation ladder are controlled by a logic circuit which is driven by outputs of the bank of comparators. Alternatively, the bank of comparators compares an input voltage of the ADC to voltage levels established by the first interpolation ladder.