Abstract: The invention relates to a method of authenticating a magnetically induced mark applied on a substrate including magnetically oriented partially reflective platelet-shaped magnetic or magnetizable pigment particles, with a portable device equipped with a light source operable to deliver visible light, an imager, a processor and a memory, the method comprising calculating, with the processor, a corresponding average intensity I of the light reflected by the partially reflective platelet-shaped magnetic or magnetizable pigment particles and collected by the imager at corresponding viewing angle ?, storing the calculated average intensities of the reflected light and corresponding viewing angles to obtain a reflected light intensity curve I(?), comparing the stored reflected light intensity curve I(?) with a stored reference reflected light intensity curve Iref(?) for said magnetically induced mark, and determining whether the magnetically induced mark is genuine based on a result of the comparison.

Abstract: The invention relates to a method of authenticating a magnetically induced mark applied on a substrate including magnetically oriented partially reflective platelet-shaped magnetic or magnetizable pigment particles, with a portable device equipped with a light source operable to deliver visible light, an imager, a processor and a memory, the method comprising calculating, with the processor, a corresponding average intensity I of the light reflected by the partially reflective platelet-shaped magnetic or magnetizable pigment particles and collected by the imager at corresponding viewing angle ?, storing the calculated average intensities of the reflected light and corresponding viewing angles to obtain a reflected light intensity curve I(?), comparing the stored reflected light intensity curve I(?) with a stored reference reflected light intensity curve Iref(?) for said magnetically induced mark, and determining whether the magnetically induced mark is genuine based on a result of the comparison.

Abstract: An imaging system (200) for generating a measure of authenticity of an object (10) comprises a dispersive imaging arrangement (30) and an image sensor arrangement (60). They are positioned so that, when electromagnetic radiation (20) from the object (10) illuminates the dispersive imaging arrangement (30), the electromagnetic radiation is dispersed and imaged by the image sensor arrangement (60). The imaging system (200) is configured to then generate a measure of authenticity of the object (10) depending at least on a relation between the imaged dispersed electromagnetic radiation and reference spectral information. The invention also relates to imaging methods, computer programs, computer program products, and storage mediums.

Abstract: An imaging system (200) for imaging and generating a measure of authenticity of an object (10) comprises a dispersive imaging arrangement (30) and an image sensor arrangement (60). They are positioned so that, when electromagnetic radiation (20) from the object (10) illuminates the dispersive imaging arrangement (30), the radiation splits out in different directions into at least a non-dispersed part (40) and a dispersed part (50), and those are imaged by the image sensor arrangement (60). The imaging system (200) is configured to then generate a measure of authenticity of the object (10) depending at least on a relation between the imaged dispersed part, the imaged non-dispersed part, and reference spectral information. The invention also relates to imaging methods, computer programs, computer program products, and storage mediums.

Abstract: An imaging system (200) for imaging and generating a measure of authenticity of an object (10) comprises a dispersive imaging arrangement (30) and an image sensor arrangement (60). They are positioned so that, when electromagnetic radiation (20) from the object (10) illuminates the dispersive imaging arrangement (30), the radiation splits out in different directions into at least a non-dispersed part (40) and a dispersed part (50), and those are imaged by the image sensor arrangement (60). The imaging system (200) is configured to then generate a measure of authenticity of the object (10) depending at least on a relation between the imaged dispersed part, the imaged non-dispersed part, and reference spectral information. The invention also relates to imaging methods, computer programs, computer program products, and storage mediums.

Abstract: An imaging system (200) for generating a measure of authenticity of an object (10) comprises a dispersive imaging arrangement (30) and an image sensor arrangement (60). They are positioned so that, when electromagnetic radiation (20) from the object (10) illuminates the dispersive imaging arrangement (30), the electromagnetic radiation is dispersed and imaged by the image sensor arrangement (60). The imaging system (200) is configured to then generate a measure of authenticity of the object (10) depending at least on a relation between the imaged dispersed electromagnetic radiation and reference spectral information. The invention also relates to imaging methods, computer programs, computer program products, and storage mediums.

Abstract: The present invention describes a method for marking an object (18), the object (18) having a surface of a conductive material. The method comprises a step of applying an electric spark to the surface such that the material is at least one of partially melted and partially ablated by the electric spark, thereby forming a pattern on the object (18). Further, the present application relates to a marking system (10) for marking an object (18) using a spark generator (12) having a counter electrode (14) and a connector (16) for electrically connecting the spark generator (12) to the surface of the object (18) to be marked. Further, the present application relates to an authenticating system for authenticating or identifying an object (18) marked by the above described method for marking the object (18).

Abstract: The present invention describes a method for marking an object (18), the object (18) having a surface of a conductive material. The method comprises a step of applying an electric spark to the surface such that the material is at least one of partially melted and partially ablated by the electric spark, thereby forming a pattern on the object (18). Further, the present application relates to a marking system (10) for marking an object (18) using a spark generator (12) having a counter electrode (14) and a connector (16) for electrically connecting the spark generator (12) to the surface of the object (18) to be marked. Further, the present application relates to an authenticating system for authenticating or identifying an object (18) marked by the above described method for marking the object (18).

Abstract: A spark optical emission spectrometer comprising: a spark source for causing spark induced emission of light from a sample; a single entrance slit; a toroidal mirror for directing the light through the single entrance slit; a plurality of diffraction gratings for diffracting light that has been directed through the entrance slit by the mirror, whereby the plurality of diffraction gratings are simultaneously illuminated; and at least one array detector for detecting the diffracted light from the plurality of diffraction gratings, wherein the minor is for directing the light through the entrance slit such that light from different regions in the spark source is spatially separated in an image of the light at the gratings whereby a first diffraction grating is preferentially illuminated with light from a first region of the spark source and simultaneously a second diffraction grating is preferentially illuminated with light from a second region of the spark source.

Abstract: A spark chamber for an optical emission analyser, comprising: a gas inlet located on a first side of the spark chamber for supplying a gas into the spark chamber; and a gas outlet located on a second side of the spark chamber arranged to convey the gas from the spark chamber; wherein an elongated electrode having an electrode axis generally along the direction of elongation is located within the spark chamber; and wherein: the first and second sides of the spark chamber lie at either side of the elongated electrode in directions generally perpendicular to the electrode axis; there is a gas flow axis through the spark chamber between the gas inlet and the gas outlet; and on passing along the gas flow axis from the gas inlet to the gas outlet the unobstructed internal cross sectional area of the spark chamber perpendicular to the gas flow axis remains constant to within a factor A, wherein A lies between 1.0 and 2.

Abstract: A spark optical emission spectrometer comprising: a spark source for causing spark induced emission of light from a sample; a single entrance slit; a toroidal mirror for directing the light through the single entrance slit; a plurality of diffraction gratings for diffracting light that has been directed through the entrance slit by the mirror, whereby the plurality of diffraction gratings are simultaneously illuminated; and at least one array detector for detecting the diffracted light from the plurality of diffraction gratings, wherein the minor is for directing the light through the entrance slit such that light from different regions in the spark source is spatially separated in an image of the light at the gratings whereby a first diffraction grating is preferentially illuminated with light from a first region of the spark source and simultaneously a second diffraction grating is preferentially illuminated with light from a second region of the spark source.

Abstract: A spark chamber for an optical emission analyser, comprising: a gas inlet located on a first side of the spark chamber for supplying a gas into the spark chamber; and a gas outlet located on a second side of the spark chamber arranged to convey the gas from the spark chamber; wherein an elongated electrode having an electrode axis generally along the direction of elongation is located within the spark chamber; and wherein: the first and second sides of the spark chamber lie at either side of the elongated electrode in directions generally perpendicular to the electrode axis; there is a gas flow axis through the spark chamber between the gas inlet and the gas outlet; and on passing along the gas flow axis from the gas inlet to the gas outlet the unobstructed internal cross sectional area of the spark chamber perpendicular to the gas flow axis remains constant to within a factor A, wherein A lies between 1.0 and 2.0.

Abstract: A method of enhancing spectral data such as a frequency, wavelength or mass spectrum comprises applying an inverse Fourier Transform to the data in the frequency, wavelength or mass spectrum, zero-filling and, optionally, apodizing that inverse transform data, and then applying a Fourier Transform to convert the inverse data back into the frequency, wavelength or mass domain. The resultant processed spectrum provides a more accurate indication of peak location, shape and height.