Abstract: There is disclosed herein an improved see-through sewing gauge comprising a gauge means for controlling the depth of a stitch during a sewing operation and having a window portion disposed therein adapted to cooperate with an opening provided in an associated throat plate so as to enable an operator to continuously monitor the condition of the bobbin thread supply disposed below said gauge. The gauge and window combination is movably secured to the throat plate of the sewing machine in such a manner as to be easily adjustable thereby enabling an operator to conveniently set the gauge to any desired depth of stitch.