Patents by Inventor Edson D. Gomersall

Edson D. Gomersall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of screening A.C. performance characteristics during D.C. parametric test operation
    Patent number: 5095267
    Abstract: A method of characterizing A.C. performance of an integrated circuit based upon D.C. measurements utilizing a process monitor circuit. The process monitor circuit provides a D.C. output having a magnitude which varies with the frequency of an oscillator section of the monitor circuit. The frequency is a function of both A.C. and D.C. performance, therefore the process monitor output signal is indicative of such performance. Since D.C. measurements may be made while the integrated circuits are in wafer form utilizing a conventional wafer prober and parametric tester, it is possible to detect A.C. performance problems very early in the manufacturing process.
    Type: Grant
    Filed: May 29, 1991
    Date of Patent: March 10, 1992
    Assignee: National Semiconductor Corporation
    Inventors: Richard B. Merrill, Edson D. Gomersall, Enayet O. Issaq
  • Method of screening A.C. performance characteristics during D.C. parametric test operation
    Patent number: 5039602
    Abstract: A method of characterizing A.C. performance of an integrated circuit based upon D.C. measurements utilizing a process monitor circuit. The process monitor circuit provides a D.C. output having a magnitude which varies with the frequency of an oscillator section of the monitor circuit. The frequency is a function of both A.C. and D.C. performance, therefore the process monitor output signal is indicative of such performance. Since D.C. measurements may be made while the integrated circuits are in wafer form utilizing a conventional wafer prober and parametric tester, it is possible to detect A.C. performance problems very early in the manufacturing process.
    Type: Grant
    Filed: March 19, 1990
    Date of Patent: August 13, 1991
    Assignee: National Semiconductor Corporation
    Inventors: Richard B. Merrill, Edson D. Gomersall, Enayet U. Issaq