Patents by Inventor Eduard Cerny
Eduard Cerny has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11544435Abstract: The present disclosure generally relates to an analog mixed-signal (AMS) design verification system. In particular, the present disclosure relates to a system and method for system verification. One example method includes: obtaining an electronic representation of the circuit design; generating at least a portion of a waveform using the electronic representation of the circuit to obtain a first segment of the waveform associated with the circuit; converting, via the one or more processors, one or more measurement functions to code for performing the one or more computations on the first segment of the waveform; performing one or more computations on the first segment of the waveform using the code; and identifying when a behavior of the circuit violates a design specification based on whether a result of the one or more computations meets a threshold.Type: GrantFiled: June 21, 2021Date of Patent: January 3, 2023Assignee: Synopsys, Inc.Inventors: Dmitry Korchemny, Ilya Kudryavtsev, Eduard Cerny, Dmitriy Mosheyev
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Patent number: 10846455Abstract: A method of verifying a circuit design, includes, in part, identifying a first groups of signals associated with the circuit, selecting a signal sampling window depth, performing a first verification of the circuit using a first test bench adapted to cause transitions in the first group of signals, storing values of the signals in the first group during each of the cycles defined by the sapling window depth to generate a first functional coverage, performing a second verification of the circuit design using a second test bench to generate a second functional coverage, comparing the second functional coverage to the first functional coverage, and automatically generating one or more cover property statements if the second functional coverage is less than the first functional coverage. The one or more cover property statements cause the second functional coverage to become equal to or greater than the first functional coverage.Type: GrantFiled: March 8, 2019Date of Patent: November 24, 2020Assignee: SYNOPSYS, INC.Inventors: Saptarshi Ghosh, Yogesh Pandey, Sivaprasad Acharya, Eduard Cerny
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Patent number: 10831956Abstract: A system receive as input a circuit design and a description of the behavior of the circuit design specified as assertions. The system generates a model used for verifying that the circuit design satisfies the specified behavior. The system generates an alternating automaton representing the assertions. The alternating automaton may be non-deterministic. The system translates the alternating automaton to a finite state machine (FSM) that may be represented using a representation such as a register transfer level (RTL) representation. The system models existential transitions in the state machine using variables. As a result, the system generates fewer states in the state machine, thereby requiring significantly less memory resources for processing the assertion. The system validates the circuit design using the state machine for further design and manufacture of the circuit.Type: GrantFiled: November 30, 2017Date of Patent: November 10, 2020Assignee: Synopsys, Inc.Inventors: Eduard Cerny, Gerald Taylor
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Publication number: 20190340327Abstract: A method of verifying a circuit design, includes, in part, identifying a first groups of signals associated with the circuit, selecting a signal sampling window depth, performing a first verification of the circuit using a first test bench adapted to cause transitions in the first group of signals, storing values of the signals in the first group during each of the cycles defined by the sapling window depth to generate a first functional coverage, performing a second verification of the circuit design using a second test bench to generate a second functional coverage, comparing the second functional coverage to the first functional coverage, and automatically generating one or more cover property statements if the second functional coverage is less than the first functional coverage. The one or more cover property statements cause the second functional coverage to become equal to or greater than the first functional coverage.Type: ApplicationFiled: March 8, 2019Publication date: November 7, 2019Inventors: Saptarshi Ghosh, Yogesh Pandey, Sivaprasad Acharya, Eduard Cerny
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Publication number: 20180157776Abstract: A system receive as input a circuit design and a description of the behavior of the circuit design specified as assertions. The system generates a model used for verifying that the circuit design satisfies the specified behavior. The system generates an alternating automaton representing the assertions. The alternating automaton may be non-deterministic. The system translates the alternating automaton to a finite state machine (FSM) that may be represented using a representation such as a register transfer level (RTL) representation. The system models existential transitions in the state machine using variables. As a result, the system generates fewer states in the state machine, thereby requiring significantly less memory resources for processing the assertion. The system validates the circuit design using the state machine for further design and manufacture of the circuit.Type: ApplicationFiled: November 30, 2017Publication date: June 7, 2018Inventors: Eduard Cerny, Gerald Taylor
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Patent number: 9626468Abstract: Groups of signals in an electronic design for which interesting assertions, such as assert, assume and cover properties, can be generated are identified. A sliding temporal window of fixed depth is used to sample unique present and past value combinations of signals in the signals groups generated by one or more simulations or emulations. The values of signals in the signal groups are organized into truth tables. Minimal functional relations are extracted from the truth tables, using techniques similar to those for synthesis of partial finite memory machines from traces, and used to generate assertions. The assertions are filtered using a cost function and pertinence heuristics, and a formal verification tool used to prune unreachable properties and generate traces for reachable cover properties. Syntactically correct assert, assume and cover property statements for the generated properties are instantiated and packaged into a file suitable for further simulation or emulation or formal verification.Type: GrantFiled: February 27, 2014Date of Patent: April 18, 2017Assignee: SYNOPSYS, INC.Inventors: Eduard Cerny, Diganchal Chakraborty, Saptarshi Ghosh, Yogesh Pandey
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Publication number: 20150242541Abstract: Groups of signals in an electronic design for which interesting assertions, such as assert, assume and cover properties, can be generated are identified. A sliding temporal window of fixed depth is used to sample unique present and past value combinations of signals in the signals groups generated by one or more simulations or emulations. The values of signals in the signal groups are organized into truth tables. Minimal functional relations are extracted from the truth tables, using techniques similar to those for synthesis of partial finite memory machines from traces, and used to generate assertions. The assertions are filtered using a cost function and pertinence heuristics, and a formal verification tool used to prune unreachable properties and generate traces for reachable cover properties. Syntactically correct assert, assume and cover property statements for the generated properties are instantiated and packaged into a file suitable for further simulation or emulation or formal verification.Type: ApplicationFiled: February 27, 2014Publication date: August 27, 2015Applicant: Synopsys, Inc.Inventors: Eduard Cerny, Diganchal Chakraborty, Saptarshi Ghosh, Yogesh Pandey
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Patent number: 8527921Abstract: One embodiment of the present invention provides a system which verifies a circuit design by biasing input stimuli for the circuit design to satisfy one or more temporal coverage properties to be verified for the circuit design. This system performs a simulation in which random input stimuli are applied to the circuit design. The system performs the simulation by using a finite state automaton (FSA) instance for a temporal coverage property to observe inputs and outputs of the circuit, and by using soft constraints associated with the FSA instance to bias the input stimuli for the circuit design so that the simulation is likely to progress through a sequence of states which satisfy the temporal coverage property.Type: GrantFiled: March 31, 2008Date of Patent: September 3, 2013Assignee: Synopsys, Inc.Inventors: Eduard Cerny, Surrendra A. Dudani, William R. Dufresne
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Patent number: 8448109Abstract: Systems and techniques for evaluating assertions during circuit verification are described. During operation, m semantically equivalent assertions can be identified, wherein each of the m semantically equivalent assertions is evaluated using n logical expressions. Next, a set of vectors based on the m semantically equivalent assertions can be determined, wherein each vector element corresponds to a logical expression that is used for evaluating one of the m semantically equivalent assertions. The m semantically equivalent assertions can then be evaluated, in parallel, using the set of vectors.Type: GrantFiled: January 31, 2012Date of Patent: May 21, 2013Assignee: Synopsys, Inc.Inventors: Eduard Cerny, Surrendra A. Dudani, Samik Sengupta
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Patent number: 7797123Abstract: One embodiment of the present invention provides systems and techniques to extract assume properties from a constrained random test-bench. During operation, the system can receive a constrained random test-bench for verifying the design-under-test (DUT), wherein the constrained random test-bench includes a statement which assigns a random value to a random variable according to a constraint. Next, the system can modify the constrained random test-bench by replacing the statement with another statement which assigns a free input variable's value to the random variable. The system can also add a statement to the constrained random test-bench that toggles a marker variable to localize the scope of the statement. The system can then generate an assume property which models the constraint on the free input variable. The assume property can then be used by a formal property verification tool to verify the DUT.Type: GrantFiled: June 23, 2008Date of Patent: September 14, 2010Assignee: Synopsys, Inc.Inventors: Kaushik De, Eduard Cerny, Pallab Dasgupta, Bhaskar Pal, Partha Pratim Chakrabarti
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Publication number: 20090319252Abstract: One embodiment of the present invention provides systems and techniques to extract assume properties from a constrained random test-bench. During operation, the system can receive a constrained random test-bench for verifying the design-under-test (DUT), wherein the constrained random test-bench includes a statement which assigns a random value to a random variable according to a constraint. Next, the system can modify the constrained random test-bench by replacing the statement with another statement which assigns a free input variable's value to the random variable. The system can also add a statement to the constrained random test-bench that toggles a marker variable to localize the scope of the statement. The system can then generate an assume property which models the constraint on the free input variable. The assume property can then be used by a formal property verification tool to verify the DUT.Type: ApplicationFiled: June 23, 2008Publication date: December 24, 2009Applicant: SYNOPSYS, INC.Inventors: Kaushik De, Eduard Cerny, Pallab Dasgupta, Bhaskar Pal, Partha Pratim Chakrabarti
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Publication number: 20090249267Abstract: One embodiment of the present invention provides a system which verifies a circuit design by biasing input stimuli for the circuit design to satisfy one or more temporal coverage properties to be verified for the circuit design. This system performs a simulation in which random input stimuli are applied to the circuit design. The system performs the simulation by using a finite state automaton (FSA) instance for a temporal coverage property to observe inputs and outputs of the circuit, and by using soft constraints associated with the FSA instance to bias the input stimuli for the circuit design so that the simulation is likely to progress through a sequence of states which satisfy the temporal coverage property.Type: ApplicationFiled: March 31, 2008Publication date: October 1, 2009Applicant: SYNOPSYS, INC.Inventors: Eduard Cerny, Surrendra A. Dudani, William R. Dufresne
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Patent number: 7454727Abstract: Relates to automatic conversion of assumption constraints, used in circuit design verification, that model an environment for testing a DUT/DUV, where the assumptions specify sequential behavior. Such assumptions are converted, with the use of logic synthesis tools, into a gate-level representation. For formal verification, a verification output is constructed from the gate-level representation and DUT/DUV assertion-monitoring circuitry. A formal verifier seeks to prove the verification output cannot indicate a design error. For simulation verification, the gate-level representation is converted into a hybrid representation comprising pipelines and combinational constraints. During simulation, the pipelines hold state information necessary for a solution, of the combinational constraints, to be in accord with the sequential assumption constraints. For certain sequential assumption constraints, the combinational constraints are insufficient to insure avoidance of deadend states.Type: GrantFiled: June 12, 2006Date of Patent: November 18, 2008Assignee: Synopsys, Inc.Inventors: Eduard Cerny, Ashvin Mark Dsouza, Kevin Michael Harer, Pei-Hsin Ho
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Patent number: 7076753Abstract: Relates to automatic conversion of assumption constraints, used in circuit design verification, that model an environment for testing a DUT/DUV, where the assumptions specify sequential behavior. Such assumptions are converted, with the use of logic synthesis tools, into a gate-level representation. For formal verification, a verification output is constructed from the gate-level representation and DUT/DUV assertion-monitoring circuitry. A formal verifier seeks to prove the verification output cannot indicate a design error. For simulation verification, the gate-level representation is converted into a hybrid representation comprising pipelines and combinational constraints. During simulation, the pipelines hold state information necessary for a solution, of the combinational constraints, to be in accord with the sequential assumption constraints. For certain sequential assumption constraints, the combinational constraints are insufficient to insure avoidance of deadend states.Type: GrantFiled: December 18, 2003Date of Patent: July 11, 2006Assignee: Synopsys, Inc.Inventors: Eduard Cerny, Ashvin Mark Dsouza, Kevin Michael Harer, Pei-Hsin Ho
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Publication number: 20050138585Abstract: Relates to automatic conversion of assumption constraints, used in circuit design verification, that model an environment for testing a DUT/DUV, where the assumptions specify sequential behavior. Such assumptions are converted, with the use of logic synthesis tools, into a gate-level representation. For formal verification, a verification output is constructed from the gate-level representation and DUT/DUV assertion-monitoring circuitry. A formal verifier seeks to prove the verification output cannot indicate a design error. For simulation verification, the gate-level representation is converted into a hybrid representation comprising pipelines and combinational constraints. During simulation, the pipelines hold state information necessary for a solution, of the combinational constraints, to be in accord with the sequential assumption constraints. For certain sequential assumption constraints, the combinational constraints are insufficient to insure avoidance of deadend states.Type: ApplicationFiled: December 18, 2003Publication date: June 23, 2005Inventors: Eduard Cerny, Ashvin Dsouza, Kevin Harer, Pei-Hsin Ho
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Patent number: 6363520Abstract: A method is provided for producing a synthesizable RT-Level specification, having a testability enhancement from a starting RT-Level specification representative of a circuit to be designed, for input to a synthesis tool to generate a gate-level circuit. The method includes the steps of performing a testability analysis on a Directed Acyclic Graph by computing and propagating Testability Measures forward and backward through VHDL statements, identifying the bits of each signal and/or variable, and adding test point statements into the specification at the RT-Level to improve testability of the circuit to be designed. The computation of Controllability and Observability method is purely functional, and does not subsume the knowledge of a gate-level implementation of the circuit being analyzed.Type: GrantFiled: June 16, 1998Date of Patent: March 26, 2002Assignee: LogicVision, Inc.Inventors: Samir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie