Patents by Inventor Edward A. Kyser, III

Edward A. Kyser, III has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10151633
    Abstract: Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.
    Type: Grant
    Filed: February 9, 2017
    Date of Patent: December 11, 2018
    Assignee: Savannah River Nuclear Solutions, LLC
    Inventors: Patrick E. O'Rourke, Robert J. Lascola, David Immel, Edward A. Kyser, III, Jean R. Plummer
  • Publication number: 20180232500
    Abstract: Analysis techniques by generation and interpretation of multivariate data that can provide for highly accurate analyte detection are described. Protocols can include a tiered principal component analysis (PCA) utilizing a partial least squares (PLS) approach for classification of a sample. Methods include selection of a particular local model for each classification category. The classification categories are determined based on assessment of sample characteristics such as solution absorbance, acidity, analyte oxidation state distribution, temperature, presence of one or more interferents, etc.
    Type: Application
    Filed: February 10, 2017
    Publication date: August 16, 2018
    Inventors: Robert J. Lascola, Patrick E. O'Rourke, David Immel, Jean R. Plummer, Edward A. Kyser, III
  • Publication number: 20180224334
    Abstract: Spectrophotometers and spectroscopy processes are described that can provide for in-line calibration at every spectral acquisition as well as for continuous response correction during sample processing. The spectrophotometers include multiple polychromatic light sources that include characteristic emission spectra for use as an internal wavelength drift calibration system that is independent of environmental factors. Correction functions provided by the internal calibration process can be applied continuously and across an entire sample spectrum. The intensity response of each spectrometer in a spectrophotometer can also be monitored and continuously corrected for stray light, dark current, readout noise, etc.
    Type: Application
    Filed: February 9, 2017
    Publication date: August 9, 2018
    Inventors: Patrick E. O'Rourke, Robert J. Lascola, David Immel, Edward A. Kyser, III, Jean R. Plummer