Abstract: In one embodiment, a channel board-to-DIB junction multi-module is provided which includes performance critical channel electronics modules within an enclosure encasing the plurality of performance critical channel electronics modules. A coolant distribution apparatus is provided within the enclosure to provide cooling within the enclosure. A channel board connection apparatus is located at a channel board end of the channel board-to-DIB junction multi-module and a cable-less connection apparatus is located at a DIB end of the channel board-to-DIB junction multi-module.

Abstract: In one embodiment, a channel board-to-DIB junction multi-module is provided which includes performance critical channel electronics modules within an enclosure encasing the plurality of performance critical channel electronics modules. A coolant distribution apparatus is provided within the enclosure to provide cooling within the enclosure. A channel board connection apparatus is located at a channel board end of the channel board-to-DIB junction multi-module and a cable-less connection apparatus is located at a DIB end of the channel board-to-DIB junction multi-module.

Abstract: A channel architecture for use in automatic test equipment is disclosed. The channel architecture comprises pattern generation circuitry and timing circuitry responsive to the pattern generation circuitry to generate timing signals. Formatting circuitry coupled to the output of the timing circuitry generates pulse waveforms for application to pin electronics circuitry. The pin electronics circuitry is responsive to the formatting circuitry for interfacing the automatic test equipment to a device-under-test. The pattern generation circuitry, the timing circuitry, the formatting circuitry and the pin electronics circuitry are formed on the same integrated circuit.

Abstract: A channel architecture for use in automatic test equipment is disclosed. The channel architecture comprises pattern generation circuitry and timing circuitry responsive to the pattern generation circuitry to generate timing signals. Formatting circuitry coupled to the output of the timing circuitry generates pulse waveforms for application to pin electronics circuitry. The pin electronics circuitry is responsive to the formatting circuitry for interfacing the automatic test equipment to a device-under-test. The pattern generation circuitry, the timing circuitry, the formatting circuitry and the pin electronics circuitry are formed on the same integrated circuit.

Abstract: A channel architecture for use in automatic test equipment is disclosed. The channel architecture comprises pattern generation circuitry and timing circuitry responsive to the pattern generation circuitry to generate timing signals. Formatting circuitry coupled to the output of the timing circuitry generates pulse waveforms for application to pin electronics circuitry. The pin electronics circuitry is responsive to the formatting circuitry for interfacing the automatic test equipment to a device-under-test. The pattern generation circuitry, the timing circuitry, the formatting circuitry and the pin electronics circuitry are formed on the same integrated circuit.

Abstract: An improved ATE and methods are provided by forming and comparing pattern bursts digitally in gallium arsenide IC's. A desired burst waveform at the DUT terminal is facilitated by setting into timing generators between bursts in effect a plurality of period waveforms constituting a palate from which by successive choice the DUT-terminal driver and comparator waveforms may be built up, each period driver waveform including a predetermined number (including zero) of rising or falling edges, any particular such edge in any particular period driver waveform being provided by the timing generators and each period comparator waveforms including voltage levels to be compared and edges provided through the timing generators, the timing generators being settable only between bursts, selection of desired palette waveforms being provided for each period by a pattern memory.

Abstract: Automatic test equipment including a circuit to measure average current consumed by a device under test. The circuit operates during the execution of a test pattern which is not dedicated to measuring average current. The average current measuring circuit sets the measurement interval to account for a lag between the current drawn by the device under test and the current being measured.

Abstract: Apparatus for testing leakage currents of input pins of an electronic device under test including a connector having a plurality of contacts for making electrical contact to respective input pins, a plurality of current measuring circuits connected to respective contacts of the connector for sensing leakage currents and providing analog outputs indicating current, a multiplexer connected to receive the analog outputs and selectively provide one analog output as a multiplexer output, and an analog-to-digital converter connected to receive the multiplexer output and provide a digital output indicating leakage current. Also disclosed are storing a limit value for each pin in a limit memory and comparing the limit values with the multiplexer outputs; using a plurality of digital-to-analog converters to selectively provide desired inputs to the input pins; and using a correction memory storing a correction value for each pin to correct the multiplexer output.