Patents by Inventor Edward Allen DeHoog

Edward Allen DeHoog has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11998276
    Abstract: A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
    Type: Grant
    Filed: November 7, 2022
    Date of Patent: June 4, 2024
    Assignee: ZeaVision, LLC
    Inventors: Scott J. Huter, Kevin Martin Magrini, Edward Allen DeHoog, Jeff Alan Burke, Nathan Franklin Engel
  • Publication number: 20230116541
    Abstract: A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
    Type: Application
    Filed: November 7, 2022
    Publication date: April 13, 2023
    Inventors: Scott J. Huter, Kevin Martin Magrini, Edward Allen DeHoog, Jeff Alan Burke, Nathan Franklin Engel
  • Patent number: 11490810
    Abstract: A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: November 8, 2022
    Assignee: ZEAVISION, LLC
    Inventors: Scott J. Huter, Kevin Martin Magrini, Edward Allen DeHoog, Jeff Alan Burke, Nathan Franklin Engel
  • Publication number: 20200107723
    Abstract: A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
    Type: Application
    Filed: December 10, 2019
    Publication date: April 9, 2020
    Inventors: Scott J. Huter, Kevin Martin Magrini, Edward Allen DeHoog, Jeff Alan Burke, Nathan Franklin Engel
  • Patent number: 10506925
    Abstract: A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
    Type: Grant
    Filed: February 2, 2018
    Date of Patent: December 17, 2019
    Assignee: ZeaVision, LLC
    Inventors: Scott J. Huter, Kevin Martin Magrini, Edward Allen DeHoog, Jeff Alan Burke, Nathan Franklin Engel
  • Publication number: 20180242843
    Abstract: A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.
    Type: Application
    Filed: February 2, 2018
    Publication date: August 30, 2018
    Inventors: Scott J. Huter, Kevin Martin Magrini, Edward Allen DeHoog, Jeff Alan Burke, Nathan Franklin Engel