Patents by Inventor Edward Belotserkovsky

Edward Belotserkovsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dual standard gloss sensor
    Patent number: 6233053
    Abstract: A single gloss sensor which can perform both DIN gloss measurement and DIN high gloss measurement, using the same hardware, and with minimal delay between the two measurements. The invention functions by directing light beams from a source to two different positions, either concurrently, or sequentially, between a position which measures gloss (75°) and a position which measures high gloss (45°).
    Type: Grant
    Filed: July 28, 1998
    Date of Patent: May 15, 2001
    Assignee: Honeywell International INC
    Inventors: John G. Preston, Edward Belotserkovsky
  • Gel point sensor
    Patent number: 6191430
    Abstract: A comparison of the specular and diffused radiation reflected from a coating can be used in ratio to locate the gel point of the coating, and to monitor coating drying characteristics. This same system may be used to monitor the drying process of the coatings in a lab setting to characterize the drying process, optimize coating quality or optimize mill efficiency. A system implementing the Applicant's method uses a radiation source to illuminate a measurement location on the coating, and then provides a first and second radiation detectors to detect reflected radiation from the coating, originating from the radiation source. One of the radiation detectors is arranged to collect specular radiation. The second detector is arranged to collect only diffused radiation. The ratio of these two values represents information about the location of the gel point for the coating, and coating drying characteristics.
    Type: Grant
    Filed: November 20, 1998
    Date of Patent: February 20, 2001
    Assignee: Honeywell International
    Inventors: Edward Belotserkovsky, John A. Dahlquist
  • Coat weight measuring and control apparatus
    Patent number: 6183561
    Abstract: A sensor and a method for determining the basis weight of a coating material containing latex on a substrate is described. The determined basis weight is insensitive to changes in the amount of substrate material underlying the coating. Signals from the sensor may be used in the control of a coating mechanism to provide a coating having a uniform basis weight.
    Type: Grant
    Filed: December 15, 1998
    Date of Patent: February 6, 2001
    Assignee: Honeywell International Inc
    Inventor: Edward Belotserkovsky
  • Silicone coat weight measuring and control apparatus
    Patent number: 6179918
    Abstract: A sensor and a method for determining the coating weight of a coating material containing silicone on a substrate is described. The determined coating weight is insensitive to changes in the amount of substrate material underlying the coating. Signals from the sensor may be used in the control of a coating mechanism to provide a coating having a uniform weight.
    Type: Grant
    Filed: November 20, 1998
    Date of Patent: January 30, 2001
    Assignee: Honeywell International Inc.
    Inventor: Edward Belotserkovsky
  • Coating weight measuring and control apparatus and method
    Patent number: 6074483
    Abstract: A sensor and a method for determining the basis weight of a coating material containing CaCO.sub.3 on a substrate is described. The determined basis weight is insensitive to changes in the amount of substrate material underlying the coating. Signals from the sensor may be used in the control of a coating mechanism to provide a coating having a uniform basis weight.
    Type: Grant
    Filed: March 26, 1998
    Date of Patent: June 13, 2000
    Assignee: Honeywell-Measurex Corporation
    Inventors: Edward Belotserkovsky, John A. Dahlquist
  • Coating weight measuring and control apparatus
    Patent number: 5795394
    Abstract: A sensor and a method for determining the basis weight of a coating material containing CaCO.sub.3 on a substrate is described. The determined basis weight is insensitive to changes in the amount of substrate material underlying the coating. Signals from the sensor may be used in the control of a coating mechanism to provide a coating having a uniform basis weight.
    Type: Grant
    Filed: June 2, 1997
    Date of Patent: August 18, 1998
    Assignee: Honeywell-Measurex
    Inventors: Edward Belotserkovsky, John A. Dahlquist