Patents by Inventor Edward Cardello

Edward Cardello has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11327823
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: May 10, 2022
    Assignee: Trividia Health, Inc.
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Publication number: 20200050509
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample.
    Type: Application
    Filed: October 21, 2019
    Publication date: February 13, 2020
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Patent number: 10459781
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Grant
    Filed: June 6, 2018
    Date of Patent: October 29, 2019
    Assignee: Trividia Health, Inc.
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Publication number: 20180285188
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Application
    Filed: June 6, 2018
    Publication date: October 4, 2018
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Patent number: 10013297
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Grant
    Filed: April 10, 2015
    Date of Patent: July 3, 2018
    Assignee: Trividia Health, Inc.
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Publication number: 20150212872
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Application
    Filed: April 10, 2015
    Publication date: July 30, 2015
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Patent number: 9029157
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: May 12, 2015
    Assignee: Nipro Diagnostics, Inc.
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello
  • Publication number: 20080254544
    Abstract: A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Inventors: Brent E. Modzelewski, Ferhan Kayihan, Edward Cardello