Abstract: The present disclosure relates to imaging systems having functionality for detecting faults in the control and/or readout of the image sensor. In one example, there is a system comprising an image sensor having a plurality of imaging pixels and at least one diagnostic pixel coupled to a reference signal. The system also comprises control and readout circuitry configured to select one or more of the imaging pixels and, for each selected imaging pixel, readout an imaging signal that is indicative of the charge accumulated on the selected imaging pixel, select the at least one diagnostic pixel and, for each selected diagnostic pixel, readout a diagnostic signal that is indicative of the reference signal of the selected diagnostic pixel, and output the diagnostic signal for use in system diagnostics.

Abstract: The present disclosure relates to a time-of-flight (ToF) system, and in particular a system which includes a controller, a light source, a first image sensor and a second image sensor. An optical path of a known distance is present between the light source and the second image sensor. The controller may be configured to determine a characteristic of the received light at the second image sensor and compare this characteristic to known values. The optical path may include an optical control switch for allowing or preventing transmission of light down the optical path.

Abstract: The present disclosure provides an improved time-of-flight system. The ToF system includes an image sensor, a controller and a light source. The controller is configured to determine at least one of a cyclic error or an offset error of the ToF system. The ToF system modifies the operation of the light source to reduce the cyclic or offset error.

Abstract: The present disclosure provides an improved time-of-flight (ToF) system. The ToF system includes a light source, a main image and a plurality of secondary image sensors. A controller is configured to determine an error of the ToF system based on charge accumulated by the plurality of secondary image sensors. The controller may be configured to determine a ToF distance measurement using the main image sensor. The error determined using the plurality of secondary image sensors may be used to correct the ToF distance measurement, improving the accuracy of the ToF system.

Abstract: An ADC circuit that can resolve the most significant bits (MSBs) using a first circuit during a first stage of a multi-stage conversion and resolve the least significant bits (LSBs) using a second circuit during a second stage of the multi-stage conversion. This can be used, for example, in massively parallel applications where the reference level generation can be shared between thousands of converters.

Abstract: A multibit flash quantizer circuit, such as included as a portion of delta-sigma conversion circuit, can be operated in a dynamic or configurable manner. Information indicative of at least one of an ADC input slew rate or a prior quantizer output code can be used to establish a flash quantizer conversion window. Within the selected conversion window, comparators in the quantizer circuit can be made active. Comparators outside the conversion window can be made dormant, such as depowered or biased to save power. An output from such dormant converters can be preloaded and latched. In this manner, full resolution is available without requiring that all comparator circuits within the quantizer remain active at all times.

Abstract: An ADC circuit that can resolve the most significant bits (MSBs) using a first circuit during a first stage of a multi-stage conversion and resolve the least significant bits (LSBs) using a second circuit during a second stage of the multi-stage conversion. This can be used, for example, in massively parallel applications where the reference level generation can be shared between thousands of converters.

Abstract: A multibit flash quantizer circuit, such as included as a portion of delta-sigma conversion circuit, can be operated in a dynamic or configurable manner. Information indicative of at least one of an ADC input slew rate or a prior quantizer output code can be used to establish a flash quantizer conversion window. Within the selected conversion window, comparators in the quantizer circuit can be made active. Comparators outside the conversion window can be made dormant, such as depowered or biased to save power. An output from such dormant converters can be preloaded and latched. In this manner, full resolution is available without requiring that all comparator circuits within the quantizer remain active at all times.