Abstract: A packaging structure and method are provided for packaging an optoelectronic device. Generally, the packaging structure includes: (i) an integrated circuit (IC) package to which the optoelectronic device is affixed; (ii) an optical plug mounted to the IC package, the optical plug positioned relative to the optoelectronic device to direct light to or from the optoelectronic device, the optical plug having an interior optical surface closest to the optoelectronic device that does not make physical contact with either the optoelectronic device or the IC package. Preferably, the packaging structure can further include air or an index matching fluid in a gap between the interior optical surface and the optoelectronic device or IC package. More preferably, both the IC package and the optical plug include features to facilitate alignment and mounting of the optical plug to the IC package during assembly. Other embodiments are also disclosed.

Abstract: The present invention discloses an optic system for providing illumination and imaging functions in an optical navigation system. Generally, the optic system includes a unitary optic component having an illumination lens and at least one prism to project a collimated beam of light from a light source in the optical navigation system onto a surface, and an imaging lens to image at least a portion of the illuminated surface to an array of photosensitive elements. In one embodiment, optic system further includes an aperture component having a precision aperture, the aperture component configured to locate the precision aperture between the imaging lens of the unitary optic component and the array of photosensitive elements in a path of light reflected from the portion of the illuminated surface to the array of photosensitive elements. Other embodiments are also described.

Abstract: In one embodiment, an optical device includes a polarization diversity module configured to receive an optical input signal and output a first optical output signal and a second optical output signal having the same polarization state. This helps ensure light beams propagating in the optical device have the same polarization state, thereby mitigating the effects of polarization-dependent loss in the optical device. In one embodiment, the optical device comprises an optical dynamic gain equalizer with a light modulator.

Abstract: A Bright Field Illumination system for inspecting a range of characteristically different kinds of defects, depressions, and ridges in a selected material surface. The system has an illumination source placed near a first focus of an elliptical reflector. In addition, a camera facing the inspected area is placed near the illumination source and the first focus. The second focus of the elliptical reflector is located at a distance approximately twice the elliptical reflector's distance above the inspected surface. The elliptical reflector directs the light from the source onto the inspected surface. Due to the shape of the elliptical reflector, light that is specularly reflected from the inspected surface is directed into the camera is which located at the position of the reflected second focus of the ellipse. This system creates a brightly lighted background field against which damage sites appear as high contrast dark objects which can be easily detected by a person or an automated inspection system.

Abstract: A laser inspection tool system (100) includes a hand-held remote tool head (108) that provides an image of a target object (116) and a measurement surface (118). The remote tool head (108) includes light sources (208) and mirrors (210) that in conjunction generate two perpendicular lines of light that impinge the target object (116) and the measurement surface (118) and reflect to a form an image in a camera (218) in the remote tool head (108). The remote tool head (108) may be oriented at any angle relative to the measurement surface (118). A processor (102) remotely coupled to the remote tool head (108) captures the image and determines the offset between the light reflected by the target object (116) and the light reflected by the measurement surface (118), and the angle between the reflected lines of light.

Abstract: An optical vision inspection system (4) and method for multiplexed illuminating, viewing, analyzing and recording a range of characteristically different kinds of defects, depressions, and ridges in a selected material surface (7) with first and second alternating optical subsystems (20, 21) illuminating and sensing successive frames of the same material surface patch. To detect the different kinds of surface features including abrupt as well as gradual surface variations, correspondingly different kinds of lighting are applied in time-multiplexed fashion to the common surface area patches under observation.

Abstract: A method for measuring the contours (30) of a three-dimensional object (4); and a method for calibrating an optical system (2, 8). The object (4) is placed into the field of view of the optical system (2, 8). The optical system (2, 8) is activated to obtain a set of data giving a phase (x.sub.t) at each of a plurality of pixels corresponding to the object (4). The phases (x.sub.t) are unwrapped, e.g., by a method of ordered phase unwrapping. The unwrapped phases are converted into a set of three-dimensional coordinates (x.sub.s, y.sub.s, z.sub.s) of the object (4) for each of the pixels. These coordinates (x.sub.s, y.sub.s, z.sub.s) can be portrayed on a display of a computer (10). The method for calibrating the optical system (2, 8) shares several common steps with the above method. In addition, coordinates of a test calibration fixture (38, 46) are first mechanically measured.

Abstract: A measurement device or system (11) for determining features of a three-dimensional object (20) from two-dimensional images includes a projector (27) for projecting a pattern (73) upon the object (20), at least one imager (17, 19) for obtaining multiple sets of image data of the illuminated object (20) and a processor (47) for obtaining a three-dimensional image (81) of the object (20) from the multiple sets of data.

Abstract: A method for measuring the contours (30) of a three-dimensional object (4); and a method for calibrating an optical system (2, 8). The object (4) is placed into the field of view of the optical system (2, 8). The optical system (2, 8) is activated to obtain a set of data giving a phase (x.sub.t) at each of a plurality of pixels corresponding to the object (4). The phases (x.sub.t) are unwrapped, e.g., by a method of ordered phase unwrapping. The unwrapped phases are converted into a set of three-dimensional coordinates (x.sub.s, y.sub.s, z.sub.s) of the object (4) for each of the pixels. These coordinates (x.sub.s, y.sub.s, z.sub.s) can be portrayed on a display of a computer (10). The method for calibrating the optical system (2, 8) shares several common steps with the above method. In addition, coordinates of a test calibration fixture (38, 46) are first mechanically measured.