Abstract: The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically are in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event.

Abstract: An electrical switch having a housing with a support member, a rocker arm pivotally coupled to the support member for movement about an axis A, a first terminal coupled to the housing, and a lever pivotally coupled to the housing for pivotal movement about an axis B. The rocker arm includes a first member located on a first side of the pivot axis A, a second member on a second side of the pivot axis A, and a first movable contact coupled to the first member. The lever is pivoted in a first direction to engage the first member on the rocker arm to move the first movable contact away from the first terminal contact to scrape debris from the first movable contact and the first terminal contact. The lever is pivoted in a second direction to engage the second member on the rocker arm to move the first movable contact into a sliding engagement with the first terminal contact.