Patents by Inventor Edward McCloud

Edward McCloud has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12135335
    Abstract: A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with different interchangeable modules for wafer testing. Modules, such as probe card positioners and air-cooled rail systems, for example, can be mounted or docked to the probe station. The wafer probe station is also provided with a front loading mechanism having a rotatable arm that rotates at least partially out of the probe station chamber for wafer loading.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: November 5, 2024
    Assignee: QualiTau, Inc.
    Inventors: Edward McCloud, Jacob Herschmann
  • Publication number: 20210396785
    Abstract: A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with different interchangeable modules for wafer testing. Modules, such as probe card positioners and air-cooled rail systems, for example, can be mounted or docked to the probe station. The wafer probe station is also provided with a front loading mechanism having a rotatable arm that rotates at least partially out of the probe station chamber for wafer loading.
    Type: Application
    Filed: September 1, 2021
    Publication date: December 23, 2021
    Inventors: Edward MCCLOUD, Jacob HERSCHMANN
  • Patent number: 11175309
    Abstract: A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with different interchangeable modules for wafer testing. Modules, such as probe card positioners and air-cooled rail systems, for example, can be mounted or docked to the probe station. The wafer probe station is also provided with a front loading mechanism having a rotatable arm that rotates at least partially out of the probe station chamber for wafer loading.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: November 16, 2021
    Assignee: QualiTau, Inc.
    Inventors: Edward McCloud, Jacob Herschmann
  • Publication number: 20160187377
    Abstract: A wafer probe station system for reliability testing of a semiconductor wafer. The wafer probe station is capable of interfacing with interchangeable modules for testing of semiconductor wafers. The wafer probe station can be used with different interchangeable modules for wafer testing. Modules, such as probe card positioners and air-cooled rail systems, for example, can be mounted or docked to the probe station. The wafer probe station is also provided with a front loading mechanism having a rotatable arm that rotates at least partially out of the probe station chamber for wafer loading.
    Type: Application
    Filed: December 21, 2015
    Publication date: June 30, 2016
    Inventors: Edward MCCLOUD, Jacob HERSCHMANN
  • Patent number: 9196516
    Abstract: A wafer temperature measurement tool for measuring the surface temperature of a semiconductor wafer. The tool can be used to measure temperature on different parts of the wafer to provide a high resolution temperature distribution map. The tool includes an internal calibrated weight that is slidably disposed within a tool body. A temperature sensor is attached to the bottom of the weight. Ceramic stands are attached to the bottom of the tool body. Gravity pulls down on the weight such that the temperature sensor contacts the wafer when the ceramic stands of the tool body are placed on the wafer.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: November 24, 2015
    Assignee: Qualitau, Inc.
    Inventors: Edward McCloud, David VandenBerg
  • Publication number: 20140269822
    Abstract: A wafer temperature measurement tool for measuring the surface temperature of a semiconductor wafer. The tool can be used to measure temperature on different parts of the wafer to provide a high resolution temperature distribution map. The tool includes an internal calibrated weight that is slidably disposed within a tool body. A temperature sensor is attached to the bottom of the weight. Ceramic stands are attached to the bottom of the tool body. Gravity pulls down on the weight such that the temperature sensor contacts the wafer when the ceramic stands of the tool body are placed on the wafer.
    Type: Application
    Filed: March 14, 2013
    Publication date: September 18, 2014
    Applicant: QUALITAU, INC.
    Inventors: Edward McCloud, David VandenBerg
  • Patent number: 5641163
    Abstract: An integrally molded table soccer playing figure has an elongated body with head and foot portions disposed at its opposite ends. A cylindrical passage axially extends laterally through an upper portion of the body and is adapted to coaxially receive a longitudinal portion of an actuating rod used to rotate and translate the playing figure. The body passage is diametrically sized to create a press-fit between the body portion and the rod portion therein, and the body is mechanically locked to the rod by a small roll pin longitudinally inserted through aligned openings in the body and rod. Integrally formed on opposite lateral sides of the body portion are relatively large diameter force receiving and diffusing washer portions.
    Type: Grant
    Filed: April 4, 1995
    Date of Patent: June 24, 1997
    Assignee: Tornado Table Sports, Inc.
    Inventor: Calvin Edward McCloud