Patents by Inventor Edward P. Fox

Edward P. Fox has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for recovery and recycling of hydrogen
    Patent number: 7988753
    Abstract: An apparatus and method for recovering and recycling hydrogen from a reforming process raises the pressure of at least one hydrogen-rich gas stream from at least one catalyst lock hopper and delivers at least a portion of the pressurized hydrogen-rich gas stream to at least one predetermined downstream location. At least another portion of the pressurized hydrogen-rich gas is used to maintain the desired pressure within the hydrogen recovery and recycling process and apparatus.
    Type: Grant
    Filed: August 28, 2009
    Date of Patent: August 2, 2011
    Assignee: Marathon Petroleum Co. LP
    Inventors: Edward P. Fox, Dennis W. Keppers, Daniel M. Barrett, Larry L. Holt, Edward A. Bullerdiek, James H. Miller
  • Method and apparatus for recovery and recycling of hydrogen
    Patent number: 7637970
    Abstract: An apparatus and method for recovering and recycling hydrogen from a reforming process raises the pressure of at least one hydrogen-rich gas stream from at least one catalyst lock hopper and delivers at least a portion of the pressurized hydrogen-rich gas stream to at least one predetermined downstream location. At least another portion of the pressurized hydrogen-rich gas is used to maintain the desired pressure within the hydrogen recovery and recycling process and apparatus.
    Type: Grant
    Filed: July 14, 2004
    Date of Patent: December 29, 2009
    Assignee: Marathon Ashland Petroleum LLC
    Inventors: Edward P. Fox, Dennis W. Keppers, Daniel M. Barrett, Larry L. Holt, Edward A. Bullerdiek, James H. Miller
  • Real time control of plasma etch utilizing multivariate statistical analysis
    Patent number: 5479340
    Abstract: Hotelling's T.sup.2 statistical analysis and control is used to provide multivariate analysis of components of an RF spectra for real time, in-situ control of an ongoing semiconductor process. An algorithm calculates the T.sup.2 value which is then used to generate a feedback signal, if the T.sup.2 value is out of range, to indicate an out-of-tolerance condition.
    Type: Grant
    Filed: September 20, 1993
    Date of Patent: December 26, 1995
    Assignees: Sematech, Inc., Intel Corporation
    Inventors: Edward P. Fox, Chandru Kappuswamy