Abstract: An occlusive device includes a covering component configured to modulate passage of blood or thrombus therethrough, and an occlusion frame that includes a plurality of elongate occlusion frame members. The elongate occlusion frame members are arranged to form a generally disc-shaped member. The occlusion frame is at least partially covered by the covering component. The device further includes an anchor frame that includes a plurality of elongate anchor frame members. The device further includes a first hub component from which the elongate frame members extend, and a second hub component from which the elongate frame members extend.

Abstract: Some embodiments provide a synchronization circuit to receive a synchronization signal, the synchronization signal substantially synchronized with a data transition, to synchronize the synchronization signal with a clock signal, and to generate a load signal based on the synchronized synchronization signal. Also provided may be a ring counter to receive the load signal from the synchronization circuit and to circularly propagate the load signal.

Abstract: Some embodiments provide a synchronization circuit to receive a synchronization signal, the synchronization signal substantially synchronized with a data transition, to synchronize the synchronization signal with a clock signal, and to generate a load signal based on the synchronized synchronization signal. Also provided may be a ring counter to receive the load signal from the synchronization circuit and to circularly propagate the load signal.

Abstract: A circuit design flow process comprises using a mapped gate-level netlist to pre-place critical electrical infrastructure on an integrated circuit (IC) die to ensure repeatability, and placing the remaining electrical infrastructure on the IC die.

Abstract: A system and method for maintaining lock of a phase locked loop within an integrated circuit during both a normal operation mode and a test mode, and during switching from the normal operation mode to the test mode, is disclosed. The method includes closing a phase locked loop feedback path of the phase locked loop with a real clock signal from a real clock tree during the normal operation mode. The real clock tree is selectively halted, thereby transitioning from the normal operation mode to the test mode. The phase locked loop feedback path of the phase locked loop is closed with a copy of a clock signal from a copy clock tree such that the phase locked loop maintains lock. The steps of halting the real clock and closing the phase locked loop feedback path with a copy clock signal are completed during a single clock cycle such that lock is maintained during switching from the normal operation to the test mode.

Abstract: An edge generation circuit phase delays pulses of a first signal propagated on an integrated circuit. The edge generation circuit includes a first variable delay circuit located on the integrated circuit, a delay line located off the integrated circuit and a second variable delay circuit located on the integrated circuit. The first variable delay circuit receives the first signal and produces a second signal which is in phase with the first signal. The delay line receives the second signal and produces a third signal. The third signal is delayed in phase from the second by a precise amount. The second variable delay circuit receives the third signal from the delay line and produces a fourth signal. The fourth signal is in phase with the third signal.